The RTIS Matte Reflectance Tester can measure the reflectance intensity of textured surfaces at different wavelengths. The test results are processed by software to calculate the photoelectric signals, ultimately presenting them as visual curves, which facilitates users in systematically characterizing the reflectance properties of the textured surfaces.

The ME-PT3000 is a specialized optical instrument for detecting the surface quality of photovoltaic (PV) cells. Based on optical principles, it combines a precision Z-axis scanning module with 3D modeling algorithms to achieve non-contact 3D scanning and imaging. This allows for the quantitative measurement of busbar height/width and the number of textured pyramids, providing feedback on the quality of cleaning, texturing, and screen printing processes.

Millennial Vision Measuring Machine equipped with a measurement system based on a high-resolution camera, allowing for fast and accurate measurement of various components.

The POLY5000 is an in-line thin film thickness tester specifically designed for monitoring photovoltaic processes. It can perform rapid, automatic 5-point synchronous scanning of samples, monitoring the thickness and optical constants of various films on the "industrial production line". It provides fast and accurate measurements of film thickness, optical constants, and other information, with customizable measurement dimensions based on customer sample sizes.

The UVPLUS SE Spectroscopic Ellipsometer is a high-performance, specialized spectral ellipsometer developed by Millennial Solar for the research and quality control of photovoltaic solar cells. It covers a wavelength range from ultraviolet to visible and near-infrared.

Offering high-precision detection of internal defects in crystalline silicon solar cells, such as crystal defects and impurities. This enables production personnel to promptly adjust process parameters and improve product quality.

FPP230 Auto is an In-Line Four Point Probe Tester specifically designed for “photovoltaic process monitoring.” It can quickly and automatically scan samples up to 230 mm in size, obtaining resistivity/resistance distribution information at different positions on the sample.

FPP230A is a automatic four point probe tester designed specifically for scientific research. It can quickly and fully automatically scan samples up to 230mm in size, obtaining resistivity/resistance distribution information from different locations on the sample.

The UVPLUS SE Spectroscopic Ellipsometer is a high-performance, specialized spectral ellipsometer developed by Millennial Solar for the research and quality control of photovoltaic solar cells. It covers a wavelength range from ultraviolet to visible and near-infrared.

The ME-PT3000 is a specialized optical instrument for detecting the surface quality of photovoltaic (PV) cells. Based on optical principles, it combines a precision Z-axis scanning module with 3D modeling algorithms to achieve non-contact 3D scanning and imaging. This allows for the quantitative measurement of busbar height/width and the number of textured pyramids, providing feedback on the quality of cleaning, texturing, and screen printing processes.

The ME-UD6300 Ultra Depth-of-Field Microscope is a detection instrument designed for sub-micron level measurements of various precision components and material surfaces. It utilizes high numerical aperture objectives and apertures, adjusting the size of the light spot and the position of the aperture to achieve varying degrees of focus at different depths, thereby realizing the ultra depth-of-field effect.

Millennial Vision Measuring Machine equipped with a measurement system based on a high-resolution camera, allowing for fast and accurate measurement of various components.

The Millennial Stylus Profilometer adopts contact - based surface topography measurement. It can measure the profiles of sample surfaces on scales ranging from micrometers to nanometers, and is capable of measuring step height, film thickness and thin - film height, surface topography, surface waviness, surface roughness, etc. It represents a new development in traditional surface topography measurement.

Offering high-precision detection of internal defects in crystalline silicon solar cells, such as crystal defects and impurities. This enables production personnel to promptly adjust process parameters and improve product quality.

The UVPLUS SE Spectroscopic Ellipsometer is a high-performance, specialized spectral ellipsometer developed by Millennial Solar for the research and quality control of photovoltaic solar cells. It covers a wavelength range from ultraviolet to visible and near-infrared.

The ME-PT3000 is a specialized optical instrument for detecting the surface quality of photovoltaic (PV) cells. Based on optical principles, it combines a precision Z-axis scanning module with 3D modeling algorithms to achieve non-contact 3D scanning and imaging. This allows for the quantitative measurement of busbar height/width and the number of textured pyramids, providing feedback on the quality of cleaning, texturing, and screen printing processes.

In the optimization of solar cell electrodes, contact resistance is an important aspect to consider. The magnitude of contact resistance is not only related to the contact geometry but also to the diffusion and sintering processes. Measuring contact resistivity can reflect issues present in the diffusion, electrode fabrication, and sintering processes.

Millennial AVT-4030 Auto Visual Tester integrates size, defect, film thickness, and tension detection into one, achieving high precision, high efficiency, and comprehensive defect detection for photovoltaic screen printing, as well as line width, line spacing, and shrinkage measurement. It is the ideal quality inspection assistant for quality control (QC) personnel.

In the optimization of solar cell electrodes, contact resistance is an important aspect to consider. The magnitude of contact resistance is not only related to the contact geometry but also to the diffusion and sintering processes. Measuring contact resistivity can reflect issues present in the diffusion, electrode fabrication, and sintering processes.