The RTIS Matte Reflectance Tester can measure the reflectance intensity of textured surfaces at different wavelengths. The test results are processed by software to calculate the photoelectric signals, ultimately presenting them as visual curves, which facilitates users in systematically characterizing the reflectance properties of the textured surfaces. It is suitable for various front-end processes such as 「texturing of monocrystalline and polycrystalline silicon, coating, etching, and wet/dry black silicon」 measuring parameters like the inversion rate, minimum wavelength point of reflectance, and total reflected energy within specified wavelength ranges for rough surfaces.

The ME-PT3000 is a specialized optical instrument for detecting the surface quality of photovoltaic (PV) cells. Based on optical principles, it combines a precision Z-axis scanning module with 3D modeling algorithms to achieve non-contact 3D scanning and imaging. This allows for the quantitative measurement of busbar height/width and the number of textured pyramids, providing feedback on the quality of cleaning, texturing, and screen printing processes. The device features a floor-standing confocal microscope structure, equipped with a damping isolation mechanism to minimize environmental vibrations. Through a matrix scanning method and signal processing algorithms, it supports high-precision 3D measurements and high-definition focused imaging, making it suitable for quality monitoring during the PV cell production process.

Millennial Vision Measuring Machine equipped with a measurement system based on a high-resolution camera, allowing for fast and accurate measurement of various components. VMM PV Basic Module: Used for detecting the patterns of photovoltaic panels, 2D planes, as well as measuring bus bar width, spacing, and the printing quality of PT values. Exclusively Developed Metal Coverage Rate Module: This module is specifically designed to calculate the coverage ratio of silver bus bars over the entire solar cell. It can quickly and automatically compute the coverage ratio using a visual graphical method, comparing it with the originally designed ratio to identify any discrepancies.

The POLY5000 is an in-line thin film thickness tester specifically designed for monitoring photovoltaic processes. It can perform rapid, automatic 5-point synchronous scanning of samples, monitoring the thickness and optical constants of various films on the "industrial production line". It provides fast and accurate measurements of film thickness, optical constants, and other information, with customizable measurement dimensions based on customer sample sizes. Utilizing Millennial's mature "film thickness measurement" technology, the POLY5000 enables users to optimize film thickness characteristics and monitor process stability in real-time.

The UVPLUS SE Spectroscopic Ellipsometer is a high-performance, specialized spectral ellipsometer developed by Millennial Solar for the research and quality control of photovoltaic solar cells. It covers a wavelength range from ultraviolet to visible and near-infrared. The device features a highly sensitive detection unit and spectral ellipsometry analysis software, specifically designed to measure and analyze the layer structure parameters (such as thickness) and physical parameters (such as refractive index n and extinction coefficient k) of single or multilayer nanofilms in the photovoltaic field.

Offering high-precision detection of internal defects in crystalline silicon solar cells, such as crystal defects and impurities. This enables production personnel to promptly adjust process parameters and improve product quality. The ME-PSC-PL/EL tandem features an intelligent detection system that can customize defect identification based on defect types, including black spots, pinholes, black corners, scratches, and more.

FPP230 Auto is an In-Line Four Point Probe Tester specifically designed for “photovoltaic process monitoring.” It can quickly and automatically scan samples up to 230 mm in size, obtaining resistivity/resistance distribution information at different positions on the sample. With the increasing level of automation among customers, the FPP230 Auto, featuring 1-9 point in-line four-probe testing with ultra-high precision and flexible design, has received widespread acclaim from automation manufacturers and customers.

FPP230A is a automatic four point probe tester designed specifically for scientific research. It can quickly and fully automatically scan samples up to 230mm in size, obtaining resistivity/resistance distribution information from different locations on the sample. The dynamic testing repeatability for ITO films can reach 0.2%, which is industry-leading. With an ultra-wide measurement range of 1mΩ to 100MΩ, it covers the vast majority of application scenarios and is widely applicable in fields such as photovoltaics, semiconductors, alloys, and ceramics.

The UVPLUS SE Spectroscopic Ellipsometer is a high-performance, specialized spectral ellipsometer developed by Millennial Solar for the research and quality control of photovoltaic solar cells. It covers a wavelength range from ultraviolet to visible and near-infrared. The device features a highly sensitive detection unit and spectral ellipsometry analysis software, specifically designed to measure and analyze the layer structure parameters (such as thickness) and physical parameters (such as refractive index n and extinction coefficient k) of single or multilayer nanofilms in the photovoltaic field.

The ME-PT3000 is a specialized optical instrument for detecting the surface quality of photovoltaic (PV) cells. Based on optical principles, it combines a precision Z-axis scanning module with 3D modeling algorithms to achieve non-contact 3D scanning and imaging. This allows for the quantitative measurement of busbar height/width and the number of textured pyramids, providing feedback on the quality of cleaning, texturing, and screen printing processes. The device features a floor-standing confocal microscope structure, equipped with a damping isolation mechanism to minimize environmental vibrations. Through a matrix scanning method and signal processing algorithms, it supports high-precision 3D measurements and high-definition focused imaging, making it suitable for quality monitoring during the PV cell production process.

The ME-UD6300 Ultra Depth-of-Field Microscope is a detection instrument designed for sub-micron level measurements of various precision components and material surfaces. It utilizes high numerical aperture objectives and apertures, adjusting the size of the light spot and the position of the aperture to achieve varying degrees of focus at different depths, thereby realizing the ultra depth-of-field effect. Combined with a precise Z-axis scanning module and 3D modeling algorithms, it performs non-contact scanning of the component surface and constructs a 3D image of the surface. The system software processes and analyzes the 3D image data, obtaining 2D and 3D parameters that reflect the surface quality of the component, thus enabling optical detection for 3D measurement of the surface morphology.

Millennial Vision Measuring Machine equipped with a measurement system based on a high-resolution camera, allowing for fast and accurate measurement of various components. VMM PV Basic Module: Used for detecting the patterns of photovoltaic panels, 2D planes, as well as measuring bus bar width, spacing, and the printing quality of PT values. Exclusively Developed Metal Coverage Rate Module: This module is specifically designed to calculate the coverage ratio of silver bus bars over the entire solar cell. It can quickly and automatically compute the coverage ratio using a visual graphical method, comparing it with the originally designed ratio to identify any discrepancies.

The Millennial Stylus Profilometer adopts contact - based surface topography measurement. It can measure the profiles of sample surfaces on scales ranging from micrometers to nanometers, and is capable of measuring step height, film thickness and thin - film height, surface topography, surface waviness, surface roughness, etc. It represents a new development in traditional surface topography measurement. Stylus Profilometer adopts a new contact type surface topography measurement, with a minimum contact force of 1mg. There are no special requirements for the reflective properties, material type, and material hardness of the sample surface. It has a wide range of sample adaptability, high data reproducibility, and stable measurement. Convenient and efficient, it is a widely used measurement method.

Offering high-precision detection of internal defects in crystalline silicon solar cells, such as crystal defects and impurities. This enables production personnel to promptly adjust process parameters and improve product quality. The ME-PSC-PL/EL tandem features an intelligent detection system that can customize defect identification based on defect types, including black spots, pinholes, black corners, scratches, and more.

The UVPLUS SE Spectroscopic Ellipsometer is a high-performance, specialized spectral ellipsometer developed by Millennial Solar for the research and quality control of photovoltaic solar cells. It covers a wavelength range from ultraviolet to visible and near-infrared. The device features a highly sensitive detection unit and spectral ellipsometry analysis software, specifically designed to measure and analyze the layer structure parameters (such as thickness) and physical parameters (such as refractive index n and extinction coefficient k) of single or multilayer nanofilms in the photovoltaic field.

The ME-PT3000 is a specialized optical instrument for detecting the surface quality of photovoltaic (PV) cells. Based on optical principles, it combines a precision Z-axis scanning module with 3D modeling algorithms to achieve non-contact 3D scanning and imaging. This allows for the quantitative measurement of busbar height/width and the number of textured pyramids, providing feedback on the quality of cleaning, texturing, and screen printing processes. The device features a floor-standing confocal microscope structure, equipped with a damping isolation mechanism to minimize environmental vibrations. Through a matrix scanning method and signal processing algorithms, it supports high-precision 3D measurements and high-definition focused imaging, making it suitable for quality monitoring during the PV cell production process.

In the optimization of solar cell electrodes, contact resistance is an important aspect to consider. The magnitude of contact resistance is not only related to the contact geometry but also to the diffusion and sintering processes. Measuring contact resistivity can reflect issues present in the diffusion, electrode fabrication, and sintering processes. The TLM-STD contact resistivity tester offers two testing functions: Contact resistivity testing and line resistance testing, which can be switched between. The contact resistivity testing is primarily used to measure contact resistance, thin film resistance, and contact resistivity; The line resistance testing is used to measure the line resistance of grid lines.

Millennial AVT-4030 Auto Visual Tester integrates size, defect, film thickness, and tension detection into one, achieving high precision, high efficiency, and comprehensive defect detection for photovoltaic screen printing, as well as line width, line spacing, and shrinkage measurement. It is the ideal quality inspection assistant for quality control (QC) personnel. The AVT-4030 employs advanced image processing technology and algorithms, featuring a user-friendly interface that allows operations to be completed in just a few steps. It also includes measurement and data statistical analysis functions to help customers analyze and improve their processes.

In the optimization of solar cell electrodes, contact resistance is an important aspect to consider. The magnitude of contact resistance is not only related to the contact geometry but also to the diffusion and sintering processes. Measuring contact resistivity can reflect issues present in the diffusion, electrode fabrication, and sintering processes. The TLM-STD contact resistivity tester offers two testing functions: Contact resistivity testing and line resistance testing, which can be switched between. The contact resistivity testing is primarily used to measure contact resistance, thin film resistance, and contact resistivity; The line resistance testing is used to measure the line resistance of grid lines.