The UVN2800-Pro spectrophotometer features a unique dual-beam optical design that effectively corrects for absorbance variations caused by different sample matrices, allowing for stable sample measurements. It offers a wide testing range, high precision, and excellent stability. The UVN2800-Pro spectrophotometer supports the measurement of solar transmittance across a broad wavelength range from the ultraviolet to the near-infrared region, providing strong support for the efficiency analysis of solar cells.

Glass Transmittance Tester PGT2400 is a powerful tool for photovoltaic glass performance testing. It has high-precision measurement accuracy and stability. It can measure the transmittance of the sample, calculate the AM1.5 effective solar transmittance, visible light transmittance, Y, x, y, L*, a*, b* and other color parameters of ultra-white embossed glass, and display CIE color coordinates and chromaticity diagrams. Equipped with an air floating platform, it ensures that when measuring the moving glass, there is frictionless movement to reduce wear and save manpower for carrying glass.

The UVPLUS SE Spectroscopic Ellipsometer is a high-performance, specialized spectral ellipsometer developed by Millennial Solar for the research and quality control of photovoltaic solar cells. It covers a wavelength range from ultraviolet to visible and near-infrared. The device features a highly sensitive detection unit and spectral ellipsometry analysis software, specifically designed to measure and analyze the layer structure parameters (such as thickness) and physical parameters (such as refractive index n and extinction coefficient k) of single or multilayer nanofilms in the photovoltaic field.

The FPP300SA is a semi-automatic four-point probe sheet resistance tester designed for scientific research. It enables fast and precise testing of samples up to 450mm x 400mm, providing sheet resistance/resistivity information at different locations. The probe head incorporates precision mechanical clock movement technology, utilizing ruby bearings to guide tungsten carbide probes, ensuring high mechanical accuracy and extended durability. Industry-leading repeatability of 0.2% is achieved for standard resistor testing. With an ultra-wide measurement range of 1mΩ~100MΩ, it accommodates diverse applications across photovoltaic, semiconductor, alloy, ceramic, and other fields.

The Millennial Stylus Profilometer adopts contact - based surface topography measurement. It can measure the profiles of sample surfaces on scales ranging from micrometers to nanometers, and is capable of measuring step height, film thickness and thin - film height, surface topography, surface waviness, surface roughness, etc. It represents a new development in traditional surface topography measurement. Stylus Profilometer adopts a new contact type surface topography measurement, with a minimum contact force of 1mg. There are no special requirements for the reflective properties, material type, and material hardness of the sample surface. It has a wide range of sample adaptability, high data reproducibility, and stable measurement. Convenient and efficient, it is a widely used measurement method.

The ME-PT3000 is a specialized optical instrument for detecting the surface quality of photovoltaic (PV) cells. Based on optical principles, it combines a precision Z-axis scanning module with 3D modeling algorithms to achieve non-contact 3D scanning and imaging. This allows for the quantitative measurement of busbar height/width and the number of textured pyramids, providing feedback on the quality of cleaning, texturing, and screen printing processes. The device features a floor-standing confocal microscope structure, equipped with a damping isolation mechanism to minimize environmental vibrations. Through a matrix scanning method and signal processing algorithms, it supports high-precision 3D measurements and high-definition focused imaging, making it suitable for quality monitoring during the PV cell production process.

The ME-UD6300 Ultra Depth-of-Field Microscope is a detection instrument designed for sub-micron level measurements of various precision components and material surfaces. It utilizes high numerical aperture objectives and apertures, adjusting the size of the light spot and the position of the aperture to achieve varying degrees of focus at different depths, thereby realizing the ultra depth-of-field effect. Combined with a precise Z-axis scanning module and 3D modeling algorithms, it performs non-contact scanning of the component surface and constructs a 3D image of the surface. The system software processes and analyzes the 3D image data, obtaining 2D and 3D parameters that reflect the surface quality of the component, thus enabling optical detection for 3D measurement of the surface morphology.

After the deposition of the transparent conductive electrode (TCO) and before the deposition of the hole - transport layer, a laser device will perform laser scribing on the sample to form independent strip - shaped conductive electrodes, which will serve as positioning points for subsequent P2 and P3 scribing. Therefore, by conducting quality inspections on P1 scribing, the efficiency, stability, uniformity, lifespan, safety, and manufacturing cost - effectiveness of perovskite solar cells can be improved in multiple aspects. The Millennial Perovskite P1 Laser Scribing Multifunctional Testing Machine is a high - precision testing device specifically designed for the P1 laser scribing process of perovskite solar cells. The device can directly contact the sample through probes to test parameters such as resistance, accurately determining the quality of P1 scribing.

Offering high-precision detection of internal defects in crystalline silicon solar cells, such as crystal defects and impurities. This enables production personnel to promptly adjust process parameters and improve product quality. The ME-PSC-PL/EL tandem features an intelligent detection system that can customize defect identification based on defect types, including black spots, pinholes, black corners, scratches, and more.

The UVPLUS SE Spectroscopic Ellipsometer is a high-performance, specialized spectral ellipsometer developed by Millennial Solar for the research and quality control of photovoltaic solar cells. It covers a wavelength range from ultraviolet to visible and near-infrared. The device features a highly sensitive detection unit and spectral ellipsometry analysis software, specifically designed to measure and analyze the layer structure parameters (such as thickness) and physical parameters (such as refractive index n and extinction coefficient k) of single or multilayer nanofilms in the photovoltaic field.

The Millennial Stylus Profilometer adopts contact - based surface topography measurement. It can measure the profiles of sample surfaces on scales ranging from micrometers to nanometers, and is capable of measuring step height, film thickness and thin - film height, surface topography, surface waviness, surface roughness, etc. It represents a new development in traditional surface topography measurement. Stylus Profilometer adopts a new contact type surface topography measurement, with a minimum contact force of 1mg. There are no special requirements for the reflective properties, material type, and material hardness of the sample surface. It has a wide range of sample adaptability, high data reproducibility, and stable measurement. Convenient and efficient, it is a widely used measurement method.

Offering high-precision detection of internal defects in crystalline silicon solar cells, such as crystal defects and impurities. This enables production personnel to promptly adjust process parameters and improve product quality. The ME-PSC-PL/EL tandem features an intelligent detection system that can customize defect identification based on defect types, including black spots, pinholes, black corners, scratches, and more.

The UVPLUS SE Spectroscopic Ellipsometer is a high-performance, specialized spectral ellipsometer developed by Millennial Solar for the research and quality control of photovoltaic solar cells. It covers a wavelength range from ultraviolet to visible and near-infrared. The device features a highly sensitive detection unit and spectral ellipsometry analysis software, specifically designed to measure and analyze the layer structure parameters (such as thickness) and physical parameters (such as refractive index n and extinction coefficient k) of single or multilayer nanofilms in the photovoltaic field.

The FPP300SA is a semi-automatic four-point probe sheet resistance tester designed for scientific research. It enables fast and precise testing of samples up to 450mm x 400mm, providing sheet resistance/resistivity information at different locations. The probe head incorporates precision mechanical clock movement technology, utilizing ruby bearings to guide tungsten carbide probes, ensuring high mechanical accuracy and extended durability. Industry-leading repeatability of 0.2% is achieved for standard resistor testing. With an ultra-wide measurement range of 1mΩ~100MΩ, it accommodates diverse applications across photovoltaic, semiconductor, alloy, ceramic, and other fields.

The Millennial Stylus Profilometer adopts contact - based surface topography measurement. It can measure the profiles of sample surfaces on scales ranging from micrometers to nanometers, and is capable of measuring step height, film thickness and thin - film height, surface topography, surface waviness, surface roughness, etc. It represents a new development in traditional surface topography measurement. Stylus Profilometer adopts a new contact type surface topography measurement, with a minimum contact force of 1mg. There are no special requirements for the reflective properties, material type, and material hardness of the sample surface. It has a wide range of sample adaptability, high data reproducibility, and stable measurement. Convenient and efficient, it is a widely used measurement method.

The online thickness measurement system utilizes spectroscopic ellipsometry principles. It analyzes alterations in the polarization state of linearly polarized light after reflection from thin-film samples. By measuring phase differences and amplitude ratios, film thickness is derived through model fitting. Featuring non-destructive testing capabilities, it preserves delicate film integrity while adapting to both wet-processing techniques (slot-die coating, inkjet printing) and vacuum deposition applications. Specifically designed for perovskite development, it enables crystallization process monitoring and large-area coating uniformity inspection, effectively minimizing photovoltaic efficiency variations.

The ME-PT3000 is a specialized optical instrument for detecting the surface quality of photovoltaic (PV) cells. Based on optical principles, it combines a precision Z-axis scanning module with 3D modeling algorithms to achieve non-contact 3D scanning and imaging. This allows for the quantitative measurement of busbar height/width and the number of textured pyramids, providing feedback on the quality of cleaning, texturing, and screen printing processes. The device features a floor-standing confocal microscope structure, equipped with a damping isolation mechanism to minimize environmental vibrations. Through a matrix scanning method and signal processing algorithms, it supports high-precision 3D measurements and high-definition focused imaging, making it suitable for quality monitoring during the PV cell production process.

The ME-UD6300 Ultra Depth-of-Field Microscope is a detection instrument designed for sub-micron level measurements of various precision components and material surfaces. It utilizes high numerical aperture objectives and apertures, adjusting the size of the light spot and the position of the aperture to achieve varying degrees of focus at different depths, thereby realizing the ultra depth-of-field effect. Combined with a precise Z-axis scanning module and 3D modeling algorithms, it performs non-contact scanning of the component surface and constructs a 3D image of the surface. The system software processes and analyzes the 3D image data, obtaining 2D and 3D parameters that reflect the surface quality of the component, thus enabling optical detection for 3D measurement of the surface morphology.

The FPP300SA is a semi-automatic four-point probe sheet resistance tester designed for scientific research. It enables fast and precise testing of samples up to 450mm x 400mm, providing sheet resistance/resistivity information at different locations. The probe head incorporates precision mechanical clock movement technology, utilizing ruby bearings to guide tungsten carbide probes, ensuring high mechanical accuracy and extended durability. Industry-leading repeatability of 0.2% is achieved for standard resistor testing. With an ultra-wide measurement range of 1mΩ~100MΩ, it accommodates diverse applications across photovoltaic, semiconductor, alloy, ceramic, and other fields.

The Millennial Stylus Profilometer adopts contact - based surface topography measurement. It can measure the profiles of sample surfaces on scales ranging from micrometers to nanometers, and is capable of measuring step height, film thickness and thin - film height, surface topography, surface waviness, surface roughness, etc. It represents a new development in traditional surface topography measurement. Stylus Profilometer adopts a new contact type surface topography measurement, with a minimum contact force of 1mg. There are no special requirements for the reflective properties, material type, and material hardness of the sample surface. It has a wide range of sample adaptability, high data reproducibility, and stable measurement. Convenient and efficient, it is a widely used measurement method.

The Millennial Steady State Solar Simulator for Solar Cell utilizes metal halide lamps that simulate full-spectrum light sources to replicate destructive light waves present in various environments. It provides corresponding environmental simulation and accelerated testing for photovoltaic solar cell product development and quality control. Light exposure tests comply with the stability test requirements specified in clauses MQT08 and MQT09 of the IEC 61215 standard. The irradiation area can be as small as 600×600 mm, and the light intensity meets BBA standards.

The Millennial Solar Cell UV Aging Test Chamber for Photovoltaic Solar Cells is a device specifically designed to simulate the ultraviolet radiation in the natural environment and conduct accelerated aging tests on photovoltaic solar cells. The test is carried out in accordance with the provisions of the MQT10 clause in the IEC61215 standard. The minimum irradiation area can be made to be 700×900mm. Its core function is to evaluate the weather resistance, anti-aging performance, and reliability of materials under long-term outdoor exposure through controllable conditions such as ultraviolet light sources and temperature and humidity regulation.

Wet Leakage Current Tester is used to verify the influence of moisture caused by rain, fog, dew or melting snow on the circuit caused by corrosion, leakage or safety accidents,ensure that the insulation performance of the module complies with the standards. This equipment meets the test standards of IEC 61215-2:2021, IEC 61730-2:2016, and UL 1703-2015.

The current continuity test system is for IEC61215 standard 10.11 high and low temperature cycle experiment clause, 10.12 wet freezing experiment clause. Mainly includes the provision of stable direct current, current recording, temperature recording and temperature control functions, through the temperature control of the DC power supply, the multi-channel current, multi-channel temperature long-term real-time monitoring. With the use of high and low temperature cycle box, it can monitor the internal circuit connectivity of multiple components.

The Bypass Diode Tester is a core inspection device specifically designed for photovoltaic modules, which is used to evaluate the conduction performance, thermal stability, and durability of bypass diodes under extreme operating conditions. As the "safety valve" of photovoltaic modules, bypass diodes can effectively prevent the hot spot effect and ensure that the modules can still operate safely when there is partial shading or when solar cells fail. This system verifies the key parameters of the diodes by accurately simulating the actual application scenarios, ensuring the long-term reliability of the modules and reducing the operation and maintenance risks of the power station.

ME-PV-HIG developed by Millennial Solar for photovoltaic industry automated testing systems, the ME-PV-HIG combines withstand voltage testing, insulation resistance measurement, and ground continuity verification in one advanced device. Standard with data acquisition software and supporting remote firmware updates via USB, it fully complies with photovoltaic standards IEC 61215 and IEC 61730.

Solar modules must withstand harsh climatic conditions during application. Among these, the high-temperature and high-humidity environment (DH test) is a core testing item for evaluating photovoltaic module reliability and material durability. This test simulates extreme "dual 85" conditions (85°C temperature and 85% RH humidity, compliant with international standards such as IEC 61215 and UL 1703). Combined with continuous cyclic testing for over 1,000 hours, it systematically validates electrical performance degradation, encapsulation material failure, and long-term reliability predictions for modules.

During the application process of solar modules, they will be subjected to the tests of various harsh weather conditions. Among them, the performance of the modules, such as their ability to withstand high temperature and high humidity as well as the subsequent impact of low temperature, and their ability to withstand long-term moisture penetration, needs to be evaluated. The HF test is carried out to verify and evaluate the reliability of the modules or materials, and to identify manufacturing defects at an early stage by inducing failure modes through thermal fatigue.

The Millennial Thermal Cycle Test Chambe is a reliability testing device specifically designed for solar modules. It accurately simulates a rapidly alternating environment of high and low temperatures to verify the performance, structural stability, and long-term durability of module products under extreme temperature conditions. Moreover, by inducing failure modes through thermal fatigue, it helps users detect potential defects in advance, thus improving product quality and market competitiveness.

Mechanical performance assessment is required for both photovoltaic (PV) modules and building - integrated photovoltaic (BIPV) systems. This assessment is a crucial step in ensuring the long - term functionality of these systems and optimizing commercial products. Performance tests are carried out through methods such as mechanical loading (ML), inhomogeneous mechanical loading (IML), and dynamic mechanical loading (DML) to verify the performance of PV modules under external mechanical loads, ensuring that the modules are free from visual damage and significant loss of electrical functionality. Dynamic Mechanical Load Tester meets the requirements for static mechanical load testing in Article 4.15 of IEC61215 - 2016 standard, Clause MST34 of IEC61730 - 2016 standard, and Clause 41 of UL1703 standard. It is controlled by an 84 - channel pressure sensor, with each cylinder independently controlled. The suction cup spacing is adjustable, and it has a universal structure to ensure

During the operation of a photovoltaic (PV) system, PV modules face various environmental challenges, including hail. When hailstones strike the surface of PV modules at high speed, they may cause serious impacts such as surface damage, cell damage, and broken connection wires. Therefore, understanding the impact of hail on PV modules and the modules' impact - resistance capabilities is crucial for ensuring the reliability and durability of the PV system. This hail impact testing machine is based on IEC61215 standard MQT17 development of hail test equipment, through the pressure impact of different diameter (artificial ice balls used to simulate hail) ice balls, and at constant speed impact components, simulate the impact of hail climate on components, verify the ability of components to resist hail impact.

This test is for IEC61215 standard MQT14 in the design and development of the leading end strength test system, testing machine is divided into tensile testing machine, torsion testing machine, adhesion testing machine 3 products. Simulation component in the installation process, the component lead end is unintentionally or intentionally pulled, the equipment to a certain quality of weight applied in the lead end reciprocating pull to judge the lead end tensile performance; The equipment uses the motor to exert a certain torsion force on the lead wire, so as to judge the performance of the lead wire torque resistance.

The MNPVQE-300Pro quantum efficiency tester is a common tool in photovoltaic research and production line quality processes, used for accurately determining the spectral response/EQE (IPCE) and IQE of solar cells. The MNPVQE-300Pro is compatible with various types of photovoltaic devices, materials, and architectures, including c-Si, mc-Si, a-Si, µ-Si, CdTe, CIGS, CIS, Ge, dye-sensitized, organic/polymer, tandem, multi-junction (2-, 3-, 4-junction, etc.), quantum wells, quantum dots, chalcogenides, and perovskites.

Millennial Maximum Power Point Tracker is a powerful and comprehensive multi-channel solar cell and component stability test system tailored for perovskite solar cell researchers. It uses a BBA-level LED solar simulator as an aging light source. It can control the temperature of the battery and the environmental atmosphere of the battery in a variety of ways (N2, dry air, constant temperature and humidity, etc.). It can perform long-term stability performancetests on multiple groups of batteries at the same time. In addition to the traditional MPPT mode, it also adds constant voltage (such as open circuit voltage) and constant current aging (such as short circuit current) modes to increase the flexibility of stability research, and integrates powerful data analysis software to view and compare the performance indicators of different samples in real time.