
Quantum Efficiency Tester
PL/EL Integrated System
PV-Reflectumeter
3D Confocal Microscope
In-Line Four Point Probe Tester
Four Point Probe Tester
In-Line Thin Film Thickness Tester
Raman Spectrometer
FTIR Spectrometer
Spectrophotometer
Automatic Spectroscopic Ellipsometer
Contact Resistance Tester
Ultra depth of field 3D microscope
Auto Visual Tester
VMM PV Vision Measuring Machine
Solar Cell Horizontal Tensile Tester
Steady State Solar Simulator for Solar Cell
Solar Cell UV Aging Test Chamber
Solar Cell Comprehensive Tensile Tester
Visual Inspection Tester
Wet Leakage Current Tester
PV Module EL Tester
PV Module UV Preconditioning Chamber
Steady State Solar Simulator for PV Module
Current Continuous Monitor
Potential Induced Degradation Test
Bypass Diode Tester
LeTID Test System
Reverse Current Overload Tester
Impulse Voltage Tester
Hipot Insulation Tester
Ground Continuity Tester
Hipot Insulation Ground Tester
Damp Heat Test Chamber
Humidity Freeze Test
Thermal Cycle Test Chamber
Dynamic Mechanical Load Tester
Static Mechanical Load Tester
Hail Impact Tester
Robustness of Termination Tester
Module Breakage Tester
Cut Susceptibility Tester
Peel Shear Strength Tester
Universal Testing Machine (Single-arm)
Universal Testing Machine (Double-arm)
Glass Transmittance Tester
Acetic Acid Test Chamber
EVA Degree of Crosslinking Test System
Junction Box Comprehensive Tester
Drop ball tester
Semi-automatic scanning four-probe tester
Stylus Profilometer
Maximum Power Point Tracker
Perovskite Glass Transmittance Tester
Perovskite P1 Laser Scribing Multifunctional Testing Machine
Perovskite Online PL Tester
Perovskite Online Sheet Resistance Tester
Online Perovskite Film Thickness Tester
Perovskite Process Inspection Workstation
Portable IV Curve Tester
Portable EL Tester
Portable Thermal Imaging Tester
Solar Module Multi-Channel Testing System
PV Inverter Power Quality Tester
Drone EL Tester
IV Tester
IVEL Cell Sorting Machine
Silicon Wafer QC
Accurate evaluation and quality sorting of silicon wafers' electrical parameters are essential for high-efficiency solar cell production, as they help reduce waste, cut costs, and improve overall yield.
Minority carrier lifetime measures bulk and surface recombination, directly indicating how efficiently photogenerated carriers are collected. The built-in electric field separates these carriers to produce photocurrent and photovoltage. Monitoring lifetime throughout key process steps is therefore critical for optimizing production and boosting conversion efficiency.
During wafer sorting, high-resolution imaging systems detect impurities and defects. Systematic analysis of factors that reduce carrier lifetime supports effective quality control in wafer slicing.
Single-Crystal Wafer PL Imaging
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HJT Solar Cell Surface Morphology Measurement
Cleaning and Texturing
As in conventional solar manufacturing, wet-chemical processing of silicon wafers in heterojunction (HJT) production fulfills three critical functions:
①Strips work damage and contamination;
②Forms a pyramidal texture for enhanced light trapping and reduced recombination;
③Removal of surface oxides and surface passivation to eliminate interface states induced by wet chemical treatment.
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Go to Product CenterPECVD Deposition and Doping of a-Si:H on Front and Back Surfaces
IDoped thin films form the emitter and BSF in heterojunction solar cells. While intrinsic a-Si:H passivates c-Si surfaces effectively, device performance depends critically on the i-layer thickness and doping gas concentration.
On the front side, an intrinsic a-Si:H layer is deposited for passivation, followed by an n-type a-Si:H layer to form the front surface field and improve carrier separation. The back side uses an intrinsic a-Si:H plus a p-type a-Si:H layer to establish the P-N junction.
Since PECVD deposition is highly sensitive to power and pressure, rigorous thin-film characterization—particularly using Raman spectroscopy—is essential to verify the formation of amorphous silicon.
Superior i-a-Si:H passivation demands a compact, hydrogen-rich structure with a high Si-H/Si-H₂ bond ratio—a key advantage over µc-Si/nc-Si. Achieving this requires exceptionally precise deposition control.
Excessive doping disrupts the a-Si network and raises interface states, while insufficient doping increases Rs and reduces FF. Doping concentration must be tightly controlled.
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Go to Product CenterDeposition of TCO Films (Front & Back Sides)
Due to the low conductivity of amorphous silicon, a transparent conductive oxide (TCO) layer is applied between the electrode and the a-Si layer in heterojunction cells to improve carrier collection. The TCO provides essential optical transparency and electrical conductivity for effective carrier extraction.
In HJT cells, TCO films are typically deposited via physical vapor deposition (PVD). Optimizing doping ratios, deposition techniques, and process parameters enhances key properties—including transmittance, bandgap, sheet resistance, carrier concentration, and mobility—leading to higher short-circuit current, fill factor, and overall conversion efficiency.
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Go to Product CenterScreen-printed Electrodes
To collect current, electrodes must form ohmic contact with both sides of the PN junction.
The industry standard is screen printing of silver paste on the front and rear sides.
Key requirements for electrode fabrication:
Excellent ITO interfacial contact, low contact resistance, high conductivity, minimal shading, and superior current collection.
Strategies to enhance cell performance:
①Narrower gridline electrodes: Reduce shading losses to improve light utilization.
②High-quality, low-resistance gridline materials: Optimize conductivity to boost FF.
③Gridlines with high aspect ratios: Increase cross-sectional conductivity while minimizing shading.
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Go to Product CenterFinished Solar Cell Testing
The inspection of finished solar cells is a critical step to ensure their performance and reliability.
Cell screening includes efficiency, spectral response, electrode adhesion, mechanical strength, and defect checks. Non-compliant cells are removed to ensure module reliability and long-term performance.
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Reliability Testing of Crystalline Silicon Pv Modules—PID Testing
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Provide end-to-end support from product to production line operation through on-site operation guidance and after-sales technical support.

































































