Offering high-precision detection of internal defects in crystalline silicon solar cells, such as crystal defects and impurities. This enables production personnel to promptly adjust process parameters and improve product quality. The ME-PSC-PL/EL tandem features an intelligent detection system that can customize defect identification based on defect types, including black spots, pinholes, black corners, scratches, and more.

The RTIS Matte Reflectance Tester can measure the reflectance intensity of textured surfaces at different wavelengths. The test results are processed by software to calculate the photoelectric signals, ultimately presenting them as visual curves, which facilitates users in systematically characterizing the reflectance properties of the textured surfaces. It is suitable for various front-end processes such as 「texturing of monocrystalline and polycrystalline silicon, coating, etching, and wet/dry black silicon」 measuring parameters like the inversion rate, minimum wavelength point of reflectance, and total reflected energy within specified wavelength ranges for rough surfaces.

The ME-PT3000 is a specialized optical instrument for detecting the surface quality of photovoltaic (PV) cells. Based on optical principles, it combines a precision Z-axis scanning module with 3D modeling algorithms to achieve non-contact 3D scanning and imaging. This allows for the quantitative measurement of busbar height/width and the number of textured pyramids, providing feedback on the quality of cleaning, texturing, and screen printing processes. The device features a floor-standing confocal microscope structure, equipped with a damping isolation mechanism to minimize environmental vibrations. Through a matrix scanning method and signal processing algorithms, it supports high-precision 3D measurements and high-definition focused imaging, making it suitable for quality monitoring during the PV cell production process.

The Millennial Solar Galaxy Solar crystallization rate tester is suitable for both spectroscopy and imaging, featuring a high spectral resolution and extremely low stray light. This ensures the accuracy and repeatability of spectral data. A series of new technologies for Raman spectral imaging have been introduced, significantly enhancing the quality and speed of Raman spectral imaging. The novel imaging algorithms can extract useful spectral information from complex big data. The unique high-efficiency asymmetric optical path design, combined with axial scanning of the grating, suppresses stray light and eliminates diffracted light, ensuring that customers can quickly and accurately obtain high signal-to-noise ratio spectra and images.

Fourier Transform Infrared Absorption Spectroscopy (FTIR) is a powerful tool for studying the relationship between the emission or absorption of radiation by various molecules in the infrared spectrum and their molecular structures. It is primarily used for the analysis of material structures. The infrared absorption spectrum can be utilized to investigate the configuration and distribution of Si-H bonds in amorphous silicon and microcrystalline silicon materials.

The Millennial Stylus Profilometer adopts contact - based surface topography measurement. It can measure the profiles of sample surfaces on scales ranging from micrometers to nanometers, and is capable of measuring step height, film thickness and thin - film height, surface topography, surface waviness, surface roughness, etc. It represents a new development in traditional surface topography measurement. Stylus Profilometer adopts a new contact type surface topography measurement, with a minimum contact force of 1mg. There are no special requirements for the reflective properties, material type, and material hardness of the sample surface. It has a wide range of sample adaptability, high data reproducibility, and stable measurement. Convenient and efficient, it is a widely used measurement method.

FPP230 Auto is an In-Line Four Point Probe Tester specifically designed for “photovoltaic process monitoring.” It can quickly and automatically scan samples up to 230 mm in size, obtaining resistivity/resistance distribution information at different positions on the sample. With the increasing level of automation among customers, the FPP230 Auto, featuring 1-9 point in-line four-probe testing with ultra-high precision and flexible design, has received widespread acclaim from automation manufacturers and customers.

FPP230A is a automatic four point probe tester designed specifically for scientific research. It can quickly and fully automatically scan samples up to 230mm in size, obtaining resistivity/resistance distribution information from different locations on the sample. The dynamic testing repeatability for ITO films can reach 0.2%, which is industry-leading. With an ultra-wide measurement range of 1mΩ to 100MΩ, it covers the vast majority of application scenarios and is widely applicable in fields such as photovoltaics, semiconductors, alloys, and ceramics.

The UVN2800-Pro spectrophotometer features a unique dual-beam optical design that effectively corrects for absorbance variations caused by different sample matrices, allowing for stable sample measurements. It offers a wide testing range, high precision, and excellent stability. The UVN2800-Pro spectrophotometer supports the measurement of solar transmittance across a broad wavelength range from the ultraviolet to the near-infrared region, providing strong support for the efficiency analysis of solar cells.

The UVPLUS SE Spectroscopic Ellipsometer is a high-performance, specialized spectral ellipsometer developed by Millennial Solar for the research and quality control of photovoltaic solar cells. It covers a wavelength range from ultraviolet to visible and near-infrared. The device features a highly sensitive detection unit and spectral ellipsometry analysis software, specifically designed to measure and analyze the layer structure parameters (such as thickness) and physical parameters (such as refractive index n and extinction coefficient k) of single or multilayer nanofilms in the photovoltaic field.

The ME-PT3000 is a specialized optical instrument for detecting the surface quality of photovoltaic (PV) cells. Based on optical principles, it combines a precision Z-axis scanning module with 3D modeling algorithms to achieve non-contact 3D scanning and imaging. This allows for the quantitative measurement of busbar height/width and the number of textured pyramids, providing feedback on the quality of cleaning, texturing, and screen printing processes. The device features a floor-standing confocal microscope structure, equipped with a damping isolation mechanism to minimize environmental vibrations. Through a matrix scanning method and signal processing algorithms, it supports high-precision 3D measurements and high-definition focused imaging, making it suitable for quality monitoring during the PV cell production process.

In the optimization of solar cell electrodes, contact resistance is an important aspect to consider. The magnitude of contact resistance is not only related to the contact geometry but also to the diffusion and sintering processes. Measuring contact resistivity can reflect issues present in the diffusion, electrode fabrication, and sintering processes. The TLM-STD contact resistivity tester offers two testing functions: Contact resistivity testing and line resistance testing, which can be switched between. The contact resistivity testing is primarily used to measure contact resistance, thin film resistance, and contact resistivity; The line resistance testing is used to measure the line resistance of grid lines.

Millennial AVT-4030 Auto Visual Tester integrates size, defect, film thickness, and tension detection into one, achieving high precision, high efficiency, and comprehensive defect detection for photovoltaic screen printing, as well as line width, line spacing, and shrinkage measurement. It is the ideal quality inspection assistant for quality control (QC) personnel. The AVT-4030 employs advanced image processing technology and algorithms, featuring a user-friendly interface that allows operations to be completed in just a few steps. It also includes measurement and data statistical analysis functions to help customers analyze and improve their processes.

Millennial Vision Measuring Machine equipped with a measurement system based on a high-resolution camera, allowing for fast and accurate measurement of various components. VMM PV Basic Module: Used for detecting the patterns of photovoltaic panels, 2D planes, as well as measuring bus bar width, spacing, and the printing quality of PT values. Exclusively Developed Metal Coverage Rate Module: This module is specifically designed to calculate the coverage ratio of silver bus bars over the entire solar cell. It can quickly and automatically compute the coverage ratio using a visual graphical method, comparing it with the originally designed ratio to identify any discrepancies.

The MNPVQE-300Pro quantum efficiency tester is a common tool in photovoltaic research and production line quality processes, used for accurately determining the spectral response/EQE (IPCE) and IQE of solar cells. The MNPVQE-300Pro is compatible with various types of photovoltaic devices, materials, and architectures, including c-Si, mc-Si, a-Si, µ-Si, CdTe, CIGS, CIS, Ge, dye-sensitized, organic/polymer, tandem, multi-junction (2-, 3-, 4-junction, etc.), quantum wells, quantum dots, chalcogenides, and perovskites.

Offering high-precision detection of internal defects in crystalline silicon solar cells, such as crystal defects and impurities. This enables production personnel to promptly adjust process parameters and improve product quality. The ME-PSC-PL/EL tandem features an intelligent detection system that can customize defect identification based on defect types, including black spots, pinholes, black corners, scratches, and more.

The Millennial Steady State Solar Simulator for Solar Cell utilizes metal halide lamps that simulate full-spectrum light sources to replicate destructive light waves present in various environments. It provides corresponding environmental simulation and accelerated testing for photovoltaic solar cell product development and quality control. Light exposure tests comply with the stability test requirements specified in clauses MQT08 and MQT09 of the IEC 61215 standard. The irradiation area can be as small as 600×600 mm, and the light intensity meets BBA standards.

The Millennial Solar Cell UV Aging Test Chamber for Photovoltaic Solar Cells is a device specifically designed to simulate the ultraviolet radiation in the natural environment and conduct accelerated aging tests on photovoltaic solar cells. The test is carried out in accordance with the provisions of the MQT10 clause in the IEC61215 standard. The minimum irradiation area can be made to be 700×900mm. Its core function is to evaluate the weather resistance, anti-aging performance, and reliability of materials under long-term outdoor exposure through controllable conditions such as ultraviolet light sources and temperature and humidity regulation.

The Millennial Solar Cell Comprehensive Tensile Tester has a horizontal module testing function. It can conduct a horizontal 180° solder strip peel strength test, with 28 sensors in use simultaneously. It can also perform cell bending tests, meeting three point and four point bending test requirements. This equipment meets the installation and testing needs of solar cells of various specifications from current mainstream manufacturers and is widely favored. It is specifically used for testing the peel force, tensile strength, etc. of related products in the photovoltaic industry, such as silicon materials, silicon wafers, and battery components.