Quantum Efficiency Tester
PL/EL Integrated System
PV-Reflectumeter
3D Confocal Microscope
In-Line Four Point Probe Tester
Four Point Probe Tester
In-Line Thin Film Thickness Tester
Raman Spectrometer
FTIR Spectrometer
Spectrophotometer
Automatic Spectroscopic Ellipsometer
Contact Resistance Tester
Ultra depth of field 3D microscope
Auto Visual Tester
VMM PV Vision Measuring Machine
Solar Cell Horizontal Tensile Tester
Steady State Solar Simulator for Solar Cell
Solar Cell UV Aging Test Chamber
Solar Cell Comprehensive Tensile Tester
Visual Inspection Tester
Wet Leakage Current Tester
PV Module EL Tester
PV Module UV Preconditioning Chamber
Steady State Solar Simulator for PV Module
Current Continuous Monitor
Potential Induced Degradation Test
Bypass Diode Tester
LeTID Test System
Reverse Current Overload Tester
Impulse Voltage Tester
Hipot Insulation Tester
Ground Continuity Tester
Hipot Insulation Ground Tester
Damp Heat Test Chamber
Humidity Freeze Test
Thermal Cycle Test Chamber
Dynamic Mechanical Load Tester
Static Mechanical Load Tester
Hail Impact Tester
Robustness of Termination Tester
Module Breakage Tester
Cut Susceptibility Tester
Peel Shear Strength Tester
Universal Testing Machine (Single-arm)
Universal Testing Machine (Double-arm)
Glass Transmittance Tester
Acetic Acid Test Chamber
EVA Degree of Crosslinking Test System
Junction Box Comprehensive Tester
Drop ball tester
Semi-automatic scanning four-probe tester
Stylus Profilometer
Maximum Power Point Tracker
Perovskite Glass Transmittance Tester
Perovskite P1 Laser Scribing Multifunctional Testing Machine
Perovskite Online PL Tester
Perovskite Online Sheet Resistance Tester
Online Perovskite Film Thickness Tester
Perovskite Process Inspection Workstation
Quantum Efficiency Tester
MNPVQE-300Pro
MNPVQE-300 Quantum Efficiency Tester
▷ Compatible with All Types of Photovoltaic Devices
Applicable to all types of photovoltaic devices: c-Si, mc-Si, α-Si, μ-Si, CdTe, CIGS, CIS, CZTS, Ge, dye-sensitized, organic, polymer, multi-junction (2-, 3-, 4-junction, etc.), quantum wells, quantum dots, and perovskites.
For different types of photovoltaic device structures, Millennial Solar provides a range of adjustable light sources and sample stage accessories, covering numerous applications from standard experiments to complex production.
▷ Wide Spectral Range
Tailored to diverse research requirements, the spectral range covers 300-1800nm for small spot sizes and can be extended up to 300-2500nm for large spot sizes. Specialized customization services are also available.
▷ Simple Operation
Powered by BENWIN PLUS application software for fully automated hardware control, the system directly generates spectral response, External Quantum Efficiency (EQE), Internal Quantum Efficiency (IQE), and short-circuit current density (Jsc) measurement reports.
▷ Accurate and Traceable
Features a dual light source system (Xenon + Halogen) for maximum source stability, combined with two grating options (300 g/mm and 1200 g/mm) to significantly enhance measurement accuracy. Results are traceable to metrology standards.
Dual Light Source System
Stable Xenon and quartz-halogen light sources, combined with a dual-grating monochromator, provide the system with a wavelength-tunable probe light covering a broad spectral range. The image from the monochromator exit slit is relayed onto the sample plane, enabling adjustable spot sizes such as 0.7x5mm, 5x5mm, and 10x10mm. Additionally, a large 230x230mm spot size can be specially customized for large-area samples.
Stable Probe Light Power: Crucial for Accurate EQE Testing
The MNPVQE-300 Quantum Efficiency Tester utilizes a 300mm long focal length monochromator with large-area gratings to ensure high spectral purity and deliver adequate output spectral power. Calibration traceable to the National Metrology Institute (NMI) is crucial for establishing reliable EQE measurements and forms the foundation for accurate results.
Application Case
EQE/IQE Testing of Photovoltaic Devices
External Quantum Efficiency (EQE), also known as Incident Photon-to-Current Conversion Efficiency (IPCE), is defined as the number of electrons supplied to the external circuit per photon incident on the device. EQE can be directly derived from the spectral response (SR) measurement.
• Total reflectance (both diffuse and specular) and total transmittance (both diffuse and normal) are measured using an integrating sphere.
• The measured spectral response can be used to predict the expected short-circuit current density (Jsc) of the device under AM1.5 standard test conditions.
• IV measurements of photovoltaic devices, used to determine Jsc and short-circuit current (Isc), should be conducted under AM1.5 illumination.
Measurement of Four-Junction Photovoltaic Cells
As photovoltaic technology evolves, so do the capabilities of the MNPVQE-300 system. This section describes the measurement of spectral response (SR), EQE, and IQE for multi-junction solar cells.
• Multi-junction photovoltaic cells are epitaxially grown on a single substrate and interconnected via tunnel diodes.
• Accurate measurement of multi-junction photovoltaic devices requires optimized optical bias for all junctions, along with voltage bias for the bottom junction.
• Once the spectral response of all component junctions is determined, EQE can be directly calculated. Additionally, by using the DTR6 integrating sphere accessory to add reflectance measurements, IQE can be computed.
Quantum Efficiency Analysis with Full-Area Coverage
Traditional small-spot testing only reflects localized cell properties, while large-spot testing covers the entire cell, ensuring results represent overall performance. Ideal for uniformity evaluation of large-area silicon and thin-film solar cells.
Example: Comparison of small-spot, large-spot, and IV testing.
Compatibility Testing for Novel Materials/Structures
Supports broad-spectrum (300-2500 nm) quantum efficiency testing for perovskite, CIGS, organic PV, and other materials, covering UV to NIR for advanced material R&D.
Example: Large-spot testing of single-junction perovskite cells.
Applications in Tandem Solar Cell Testing
♦ Layer-by-Layer Photoresponse Analysis
Tandem cells consist of multiple absorption layers with different bandgaps (e.g., perovskite/silicon, perovskite/CIGS). The quantum efficiency tester performs wavelength scanning (250–2500 nm) to sequentially excite each sub-cell, measuring external quantum efficiency (EQE) and internal quantum efficiency (IQE).
♦ Bias Light & Bias Voltage System
Millennialsolar QE testers (both large and small spot) feature integrated bias light and bias voltage settings, simplifying experiments and significantly improving efficiency.♢ Bias Light Functionality:
Activates tandem cell conductivity: For perovskite/silicon tandems, the silicon sub-cell must be saturated with bias light during perovskite layer testing to ensure the perovskite sub-cell operates properly.
Simulates real-world conditions: Combines monochromatic light with AM1.5G standard spectrum illumination to replicate actual working environments and reduce testing errors.
♢ Bias Voltage Functionality:
Optimizes carrier transport: Applies forward or reverse bias to regulate electric field distribution, analyzing carrier transport efficiency and recombination mechanisms.
Synergistic Advantages of Bias Light and Bias Voltage : Example, when testing the EQE of a perovskite top layer, a 980 nm bias light is used to activate the underlying silicon sub-cell, while a bias voltage is applied to suppress interfacial recombination, ensuring data accuracy.
Silicon photodiode (300-1100 nm), including calibration certificate.
Germanium photodiode (900-1800 nm), with 10 nm intervals, including calibration certificate.
Xenon lamp lifespan ≥ 4000 hours
Halogen lamp lifespan ≥ 1500 hours
Built-in optical chopper, frequency continuously adjustable from 100-1000 Hz
Monochromatic spectral wavelength accuracy: ±0.1 nm
Monochromatic spectral range: 300 - 2500 nm
Measurement wavelength interval: adjustable from 1-25 nm
Small spot size: 0.75 mm × 5 mm
Medium spot sizes: 5 mm × 5 mm; 10 mm × 10 mm
Large spot size: 230 mm × 230 mm
Reflectance and transmittance configuration (for IQE testing), two functional ports, switchable
Normal incidence integrating sphere function: diameter 100 mm, test range 300-1100 nm
8-degree angle integrating sphere function: diameter 100 mm, test range: 300 nm - 2500 nm
Millennial Solar measurement software: calibration, generation of SR, EQE, IQE, R (reflectance), T (transmittance) test data and charts.
Fast Delivery and Comprehensive Support
Provide end-to-end support from product to production line operation through on-site operation guidance and after-sales technical support.