Non-contact IV tester

Quantum Efficiency Tester
PL/EL Integrated System
PV-Reflectumeter
3D Confocal Microscope
In-Line Four Point Probe Tester
Four Point Probe Tester
In-Line Thin Film Thickness Tester
Raman Spectrometer
FTIR Spectrometer
Spectrophotometer
Automatic Spectroscopic Ellipsometer
Contact Resistance Tester
Ultra depth of field 3D microscope
Auto Visual Tester
VMM PV Vision Measuring Machine
Solar Cell Horizontal Tensile Tester
Steady State Solar Simulator for Solar Cell
Solar Cell UV Aging Test Chamber
Solar Cell Comprehensive Tensile Tester
Visual Inspection Tester
Wet Leakage Current Tester
PV Module EL Tester
PV Module UV Preconditioning Chamber
Steady State Solar Simulator for PV Module
Current Continuous Monitor
Potential Induced Degradation Test
Bypass Diode Tester
LeTID Test System
Reverse Current Overload Tester
Impulse Voltage Tester
Hipot Insulation Tester
Ground Continuity Tester
Hipot Insulation Ground Tester
Damp Heat Test Chamber
Humidity Freeze Test
Thermal Cycle Test Chamber
Dynamic Mechanical Load Tester
Static Mechanical Load Tester
Hail Impact Tester
Robustness of Termination Tester
Module Breakage Tester
Cut Susceptibility Tester
Peel Shear Strength Tester
Universal Testing Machine (Single-arm)
Universal Testing Machine (Double-arm)
Glass Transmittance Tester
Acetic Acid Test Chamber
EVA Degree of Crosslinking Test System
Junction Box Comprehensive Tester
Drop ball tester
Semi-automatic scanning four-probe tester
Stylus Profilometer
Maximum Power Point Tracker
Perovskite Glass Transmittance Tester
Perovskite P1 Laser Scribing Multifunctional Testing Machine
Perovskite Online PL Tester
Perovskite Online Sheet Resistance Tester
Online Perovskite Film Thickness Tester
Perovskite Process Inspection Workstation
Portable EL Tester
Portable Thermal Imaging Tester
Solar Module Multi-Channel Testing System
PV Inverter Power Quality Tester
IV Tester
IVEL Cell Sorting Machine
Quantum Efficiency Tester
MNPVQE-1800T PRO
MNPVQE-300 Quantum Efficiency Tester
Compatible with all PV technologies: c-Si, thin-film, organic, multi-junction, quantum, and perovskite. Offers customizable light sources and stages for R&D to production.
▷ Wide Spectral Range
▷ Simple Operation
▷ Accurate and Traceable
Dual Light Source System
Dual Light Sources: Xenon Lamp & Quartz-halogen lamp
Dual-Grating Monochromator: Provides wavelength-tunable probe light across a broad spectral range of 300–1600 nm.
Flexible Small-Spot & Large-Spot QE Testing
Small Spot Mode: Enables localized QE measurements for evaluating specific areas of solar cells.
Large Spot Mode: Covers the entire cell for a more representative assessment of overall performance. Ideal for evaluating uniformity in large-area silicon and thin-film solar cells.
Adjustable Spot Sizes
Selectable small spot sizes can match different grid spacing, such as 1mm×1mm、4mm×1mm 、4mm×2mm
Customizable Large Spot
A 230×230 mm spot size can be specially customized for large-area samples.
Stable Probe Light Power
A 300mm monochromator : Equipped with large-area gratings to deliver high spectral purity and optical power.
NMI-traceable calibration : Ensures reliable EQE measurement results.
Broad Testing Compatibility with Novel PV Materials and Structures
Supports broad-spectrum (300-1600nm) quantum efficiency testing for perovskite, CIGS, organic PV, and other materials, covering UV to NIR for advanced material R&D.
Example: Large-spot testing of single-junction perovskite cells.
QE Testing Applications
EQE/IQE Testing of Photovoltaic Devices
• Supports EQE/IPCE, reflectance, and transmittance measurements, as well as Jsc prediction and IV testing under AM1.5 conditions.
EQE/IQE Testing of Multi-Junction Solar Cells
• Enables EQE/IQE analysis of multi-junction cells through optimized light and voltage bias, spectral response, and integrating sphere measurements.
Applications in Tandem Solar Cell Testing
♦ Layer-by-Layer Photoresponse Analysis
Tandem cells use multiple bandgap absorption layers (e.g., perovskite/Si, perovskite/CIGS). The QE tester scans 300-1600nm to excite each sub-cell sequentially, measuring EQE and IQE.
♦ Bias Light & Bias Voltage System
Millennialsolar QE testers (large/small spot) feature integrated bias light and voltage, streamlining experiments and boosting efficiency.Silicon photodiode (300-1100 nm), including calibration certificate.
Germanium photodiode (900-1800 nm), with 10 nm intervals, including calibration certificate.
Xenon lamp lifespan ≥ 4000 hours
Halogen lamp lifespan ≥ 1500 hours
Built-in optical chopper, frequency continuously adjustable from 100-1000 Hz
Monochromatic spectral wavelength accuracy: ±0.1 nm
Monochromatic spectral range: 300 - 2500 nm
Measurement wavelength interval: adjustable from 1-25 nm
Small spot size: 0.75 mm × 5 mm
Medium spot sizes: 5 mm × 5 mm; 10 mm × 10 mm
Large spot size: 230 mm × 230 mm
Reflectance and transmittance configuration (for IQE testing), two functional ports, switchable
Normal incidence integrating sphere function: diameter 100 mm, test range 300-1100 nm
8-degree angle integrating sphere function: diameter 100 mm, test range: 300 nm - 2500 nm
Millennial Solar measurement software: calibration, generation of SR, EQE, IQE, R (reflectance), T (transmittance) test data and charts.
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Fast Delivery and Comprehensive Support
Provide end-to-end support from product to production line operation through on-site operation guidance and after-sales technical support.
































































