Quantum Efficiency Tester
PL/EL Integrated System
PV-Reflectumeter
3D Confocal Microscope
In-Line Four Point Probe Tester
Four Point Probe Tester
In-Line Thin Film Thickness Tester
Raman Spectrometer
FTIR Spectrometer
Spectrophotometer
Automatic Spectroscopic Ellipsometer
Contact Resistance Tester
Ultra depth of field 3D microscope
Auto Visual Tester
VMM PV Vision Measuring Machine
Solar Cell Horizontal Tensile Tester
Steady State Solar Simulator for Solar Cell
Solar Cell UV Aging Test Chamber
Solar Cell Comprehensive Tensile Tester
Visual Inspection Tester
Wet Leakage Current Tester
PV Module EL Tester
PV Module UV Preconditioning Chamber
Steady State Solar Simulator for PV Module
Current Continuous Monitor
Potential Induced Degradation Test
Bypass Diode Tester
LeTID Test System
Reverse Current Overload Tester
Impulse Voltage Tester
Hipot Insulation Tester
Ground Continuity Tester
Hipot Insulation Ground Tester
Damp Heat Test Chamber
Humidity Freeze Test
Thermal Cycle Test Chamber
Dynamic Mechanical Load Tester
Static Mechanical Load Tester
Hail Impact Tester
Robustness of Termination Tester
Module Breakage Tester
Cut Susceptibility Tester
Peel Shear Strength Tester
Universal Testing Machine (Single-arm)
Universal Testing Machine (Double-arm)
Glass Transmittance Tester
Acetic Acid Test Chamber
EVA Degree of Crosslinking Test System
Junction Box Comprehensive Tester
Drop ball tester
Semi-automatic scanning four-probe tester
Stylus Profilometer
Maximum Power Point Tracker
Perovskite Glass Transmittance Tester
Perovskite P1 Laser Scribing Multifunctional Testing Machine
Perovskite Online PL Tester
Perovskite Online Sheet Resistance Tester
Online Perovskite Film Thickness Tester
Perovskite Process Inspection Workstation
PV Module EL Tester
ME-PV-EL
Accurately identify hidden defects and build a solid quality defense line
The EL tester applies an electric current to the photovoltaic module, stimulating the recombination and luminescence of the carriers inside the solar cells. It uses a high-sensitivity infrared camera to capture the luminescent images. In the defective areas (such as cracks, broken busbars, etc.), due to the weakening or disappearance of the luminescence intensity, dark spots or abnormally bright spots appear in the images, thus enabling non-destructive testing.
In a laboratory environment, the device usually supports high-resolution imaging (e.g., 30 million pixels), synchronous detection of multiple components, and automated data analysis, which improves the detection efficiency.
Functional Features:
Camera Parameter Adjustment: Supports adjustment of camera parameters, including exposure time, ISO value, aperture, etc.
Image Correction Adjustment: Enables distortion correction for EL images.
Power Supply Parameter Tuning & High/Low Current Control: Sets constant voltage and current parameters for each test mode, allowing one-click high/low current testing.
Barcode Input: Facilitates automatic input of the ID for components under test via a barcode scanner.
Image Naming: Images with an input ID are named using the ID number; for images without an input ID, naming follows the date and time format.
Image Auto-storage & Export: Stores images in a directory structure: root directory → date folder → defect category folder → test image.
EL Test Report Export: Exports reports on the EL test results of clients’ photovoltaic components.
Fast Delivery and Comprehensive Support
Provide end-to-end support from product to production line operation through on-site operation guidance and after-sales technical support.