Quantum Efficiency Tester
PL/EL Integrated System
PV-Reflectumeter
3D Confocal Microscope
In-Line Four Point Probe Tester
Four Point Probe Tester
In-Line Thin Film Thickness Tester
Raman Spectrometer
FTIR Spectrometer
Spectrophotometer
Automatic Spectroscopic Ellipsometer
Contact Resistance Tester
Ultra depth of field 3D microscope
Auto Visual Tester
VMM PV Vision Measuring Machine
Solar Cell Horizontal Tensile Tester
Steady State Solar Simulator for Solar Cell
Solar Cell UV Aging Test Chamber
Solar Cell Comprehensive Tensile Tester
Visual Inspection Tester
Wet Leakage Current Tester
PV Module EL Tester
PV Module UV Preconditioning Chamber
Steady State Solar Simulator for PV Module
Current Continuous Monitor
Potential Induced Degradation Test
Bypass Diode Tester
LeTID Test System
Reverse Current Overload Tester
Impulse Voltage Tester
Hipot Insulation Tester
Ground Continuity Tester
Hipot Insulation Ground Tester
Damp Heat Test Chamber
Humidity Freeze Test
Thermal Cycle Test Chamber
Dynamic Mechanical Load Tester
Static Mechanical Load Tester
Hail Impact Tester
Robustness of Termination Tester
Module Breakage Tester
Cut Susceptibility Tester
Peel Shear Strength Tester
Universal Testing Machine (Single-arm)
Universal Testing Machine (Double-arm)
Glass Transmittance Tester
Acetic Acid Test Chamber
EVA Degree of Crosslinking Test System
Junction Box Comprehensive Tester
Drop ball tester
Semi-automatic scanning four-probe tester
Stylus Profilometer
Maximum Power Point Tracker
Perovskite Glass Transmittance Tester
Perovskite P1 Laser Scribing Multifunctional Testing Machine
Perovskite Online PL Tester
Perovskite Online Sheet Resistance Tester
Online Perovskite Film Thickness Tester
Perovskite Process Inspection Workstation
Potential Induced Degradation Test
ME-PV-PID
What is the Potential Induced Degradation (PID) Test?
Potential Induced Degradation (PID) has been identified as a serious issue affecting the reliability of silicon solar cell modules. Both crystalline silicon and thin-film PV modules are vulnerable to PID. In grid-connected PV systems, the panels are usually connected in series to generate a high-voltage output, and for electrical safety reasons, the module frames are grounded. However, this configuration creates a high potential difference between the solar cells within the module and the module frame. The high potential difference may cause a leakage current to flow from the module frame to the solar cells, which can lead to PID.
PID can be influenced by many factors, such as the anti-reflective coating, encapsulation materials, module structure, and the nature of the system. Surrounding environmental conditions, such as temperature, light intensity, or humidity, can also affect the degree of degradation.
The PID test is a quality assurance test conducted for photovoltaic modules to predict their long-term performance under different conditions. The modules are placed at a temperature of 85°C, with a humidity of approximately 85%, and under a load of 1000 volts for 96 hours. The PID test simulates the power loss of the modules when they are exposed to sub-voltage and temperature conditions.
Functional Features of ME-PV-PID
♦ The module frame is grounded,which not only simulates the actual situation,but also prevents potential dangers caused by high voltage on the frame during the test;
♦ For each module,a2-wire test method is adopted,with 1 high-voltage wire and 1 ground wire.The high-voltage wire is connect- ed to the inside of the module through the junction box,and the ground wire is connected to the frame or connected to other effective locations;
♦ Voltage,leakage current and insulation resistance are displayed simultaneously;
♦ Real-time monitoring of voltage,leakage current,and insulation resistance curves;
♦ The test time can be set and automatically stopped;
♦ The screen displays the test situation and records the data during the test;
♦ Test data can be exported to EXCEL,CSV and other format files;
♦ Enter the module serial number,test time period,and test name to query historical data and curves;
♦ Alarm parameters can be set individually,such as overcurrent alarm.
Voltage range: -2500~2500V;
Voltage accuracy: 0.1%FS;
Voltage resolution: 1V;
Current capability: 1mA
Test range: -1~1mA;
Test accuracy: 0.5%FS;
Resolution: 0.001mA
Support RS485 communication, and 0-5V, 0-10V, 4-20mA signal input;
14-bit resolution;
20-channel analog input
T/C software configuration for low-voltage current input;
Support Modbus/RTU control;
Memory: 8G DDR;
Hard disk: 1T;
Monitor: 23-inch display
Material: Silicone;
Withstand voltage rating: 25KV;
Core diameter: 0.5mm², stranded copper wire;
Operating temperature: -60-250°C;
Outer diameter: 5.8mm;
Length: 6m/set (standard configuration)
Temperature range: -40-120°C;
Accuracy: ±1°C;
Humidity range: 0-100%RH;
Accuracy: ±3%RH
Fast Delivery and Comprehensive Support
Provide end-to-end support from product to production line operation through on-site operation guidance and after-sales technical support.