Quantum Efficiency Tester
PL/EL Integrated System
PV-Reflectumeter
3D Confocal Microscope
In-Line Four Point Probe Tester
Four Point Probe Tester
In-Line Thin Film Thickness Tester
Raman Spectrometer
FTIR Spectrometer
Spectrophotometer
Automatic Spectroscopic Ellipsometer
Contact Resistance Tester
Ultra depth of field 3D microscope
Auto Visual Tester
VMM PV Vision Measuring Machine
Solar Cell Horizontal Tensile Tester
Steady State Solar Simulator for Solar Cell
Solar Cell UV Aging Test Chamber
Solar Cell Comprehensive Tensile Tester
Visual Inspection Tester
Wet Leakage Current Tester
PV Module EL Tester
PV Module UV Preconditioning Chamber
Steady State Solar Simulator for PV Module
Current Continuous Monitor
Potential Induced Degradation Test
Bypass Diode Tester
LeTID Test System
Reverse Current Overload Tester
Impulse Voltage Tester
Hipot Insulation Tester
Ground Continuity Tester
Hipot Insulation Ground Tester
Damp Heat Test Chamber
Humidity Freeze Test
Thermal Cycle Test Chamber
Dynamic Mechanical Load Tester
Static Mechanical Load Tester
Hail Impact Tester
Robustness of Termination Tester
Module Breakage Tester
Cut Susceptibility Tester
Peel Shear Strength Tester
Universal Testing Machine (Single-arm)
Universal Testing Machine (Double-arm)
Glass Transmittance Tester
Acetic Acid Test Chamber
EVA Degree of Crosslinking Test System
Junction Box Comprehensive Tester
Drop ball tester
Semi-automatic scanning four-probe tester
Stylus Profilometer
Maximum Power Point Tracker
Perovskite Glass Transmittance Tester
Perovskite P1 Laser Scribing Multifunctional Testing Machine
Perovskite Online PL Tester
Perovskite Online Sheet Resistance Tester
Online Perovskite Film Thickness Tester
Perovskite Process Inspection Workstation
Automatic Spectroscopic Ellipsometer
UVPLUS SE
Powerful Features of UVPLUS SE
Advanced Rotating Compensate Measurement Technology
Delta measurement range of 0-360°, with no measurement dead zone issues, and can eliminate the effects of depolarization caused by rough surfaces on the results.
High-Sensitivity Measurement of Rough Velvet Nano Films
Advanced optical energy enhancement technology, high signal-to-noise ratio detection technology, and high signal-to-noise ratio weak signal processing methods enable high-sensitivity detection of velvet solar cell surface coatings characterized by predominant scattering from rough surfaces and extremely low reflectivity.
Second-Level Full-Spectrum Measurement Speed
Typical full-spectrum measurement takes 5-10 seconds.
Atomic Layer-Level Detection Sensitivity
Measurement accuracy can reach 0.05 nm.
Multi-Angle Incident Adjustment
The multi-angle incident structure design enhances the flexibility of instrument measurements, making it particularly suitable for measuring complex samples.
Typical samples include:
Single-layer or multi-layer nanofilms on wafers.
Passivation film testing for textured solar cells using processes such as PERC, TOPCon, HJT, and IBC.
Perovskite transparent conductive substrates (TCO), electron transport layers (ETL), and hole transport layers (HTL).
Single-layer anti-reflective films (such as Al2O3, SiNx, SiO2, TiO2, etc.) and double-layer anti-reflective film testing (such as SiNx/SiO2, SiNx2/SiNx1, SiNx/Al2O3, etc.), which can also be used to measure the optical properties of bulk materials.
Fast Delivery and Comprehensive Support
Provide end-to-end support from product to production line operation through on-site operation guidance and after-sales technical support.