Quantum Efficiency Tester
PL/EL Integrated System
PV-Reflectumeter
3D Confocal Microscope
In-Line Four Point Probe Tester
Four Point Probe Tester
In-Line Thin Film Thickness Tester
Raman Spectrometer
FTIR Spectrometer
Spectrophotometer
Automatic Spectroscopic Ellipsometer
Contact Resistance Tester
Ultra depth of field 3D microscope
Auto Visual Tester
VMM PV Vision Measuring Machine
Solar Cell Horizontal Tensile Tester
Steady State Solar Simulator for Solar Cell
Solar Cell UV Aging Test Chamber
Solar Cell Comprehensive Tensile Tester
Visual Inspection Tester
Wet Leakage Current Tester
PV Module EL Tester
PV Module UV Preconditioning Chamber
Steady State Solar Simulator for PV Module
Current Continuous Monitor
Potential Induced Degradation Test
Bypass Diode Tester
LeTID Test System
Reverse Current Overload Tester
Impulse Voltage Tester
Hipot Insulation Tester
Ground Continuity Tester
Hipot Insulation Ground Tester
Damp Heat Test Chamber
Humidity Freeze Test
Thermal Cycle Test Chamber
Dynamic Mechanical Load Tester
Static Mechanical Load Tester
Hail Impact Tester
Robustness of Termination Tester
Module Breakage Tester
Cut Susceptibility Tester
Peel Shear Strength Tester
Universal Testing Machine (Single-arm)
Universal Testing Machine (Double-arm)
Glass Transmittance Tester
Acetic Acid Test Chamber
EVA Degree of Crosslinking Test System
Junction Box Comprehensive Tester
Drop ball tester
Semi-automatic scanning four-probe tester
Stylus Profilometer
Maximum Power Point Tracker
Perovskite Glass Transmittance Tester
Perovskite P1 Laser Scribing Multifunctional Testing Machine
Perovskite Online PL Tester
Perovskite Online Sheet Resistance Tester
Online Perovskite Film Thickness Tester
Perovskite Process Inspection Workstation
Perovskite Online PL Tester
Pain Points of Traditional PL Defect Detection in Solar Cells
1.Offline Sampling: Traditional PL testing requires offline sampling, resulting in slow speeds incompatible with high-speed production lines.
2.Undetectable Microscopic Defects: Micro-defects (e.g., pinholes, grain boundary cracks) cannot be localized via conventional electrical tests (IV curves), leading to batch scrapping.
3.Destructive Methods: Electroluminescence (EL) testing requires electrical contact, risking damage to unencapsulated cells. Cross-sectional SEM analysis destroys samples.
4.Incompatibility with Advanced Structures: Flexible substrates and complex tandem cell designs are unsuitable for traditional contact-based methods (e.g., probes).
Advantages of Perovskite Online PL Tester
1.High-Speed In-Line Scanning: Fully synchronized with production line speeds.
2.High-Resolution Imaging: PL imaging precision <50 μm/pixel, accurately identifying defect types (e.g., dark spots indicating carrier recombination centers).
3.Closed-Loop Process Control: Real-time defect distribution feedback to optimize coating/annealing parameters (e.g., spin-coating speed, annealing gradients).
4.Early-Stage Defect Detection: Identifies defects at semi-finished stages (post-coating), minimizing downstream resource waste.
5.Non-Contact Testing: Ideal for flexible perovskite cells and tandem structures.
Core Features
Large-Area Compatibility:
Supports 60cm×120cm, 120cm×240cm, and custom sizes.
High-Precision PL Imaging:
Line-scan laser technology with <50 μm/pixel resolution (customizable).
16-Bit Grayscale Imaging:
Captures subtle details, avoiding over/underexposure in high/low-brightness regions.
Rapid Defect Detection:
≤2s testing cycle, <0.1% missed detection rate, <0.3% false alarm rate.
AI-Driven Defect Classification:
Full-automatic defect recognition and process feedback via deep learning.
Defect Statistics & Grading:
Classifies defect types, quantifies ratios, and grades severity (e.g., dark spot size). Custom OK/NG criteria based on client requirements.
Fast Delivery and Comprehensive Support
Provide end-to-end support from product to production line operation through on-site operation guidance and after-sales technical support.