
Quantum Efficiency Tester
PL/EL Integrated System
PV-Reflectumeter
3D Confocal Microscope
In-Line Four Point Probe Tester
Four Point Probe Tester
In-Line Thin Film Thickness Tester
Raman Spectrometer
FTIR Spectrometer
Spectrophotometer
Automatic Spectroscopic Ellipsometer
Contact Resistance Tester
Ultra depth of field 3D microscope
Auto Visual Tester
VMM PV Vision Measuring Machine
Solar Cell Horizontal Tensile Tester
Steady State Solar Simulator for Solar Cell
Solar Cell UV Aging Test Chamber
Solar Cell Comprehensive Tensile Tester
Visual Inspection Tester
Wet Leakage Current Tester
PV Module EL Tester
PV Module UV Preconditioning Chamber
Steady State Solar Simulator for PV Module
Current Continuous Monitor
Potential Induced Degradation Test
Bypass Diode Tester
LeTID Test System
Reverse Current Overload Tester
Impulse Voltage Tester
Hipot Insulation Tester
Ground Continuity Tester
Hipot Insulation Ground Tester
Damp Heat Test Chamber
Humidity Freeze Test
Thermal Cycle Test Chamber
Dynamic Mechanical Load Tester
Static Mechanical Load Tester
Hail Impact Tester
Robustness of Termination Tester
Module Breakage Tester
Cut Susceptibility Tester
Peel Shear Strength Tester
Universal Testing Machine (Single-arm)
Universal Testing Machine (Double-arm)
Glass Transmittance Tester
Acetic Acid Test Chamber
EVA Degree of Crosslinking Test System
Junction Box Comprehensive Tester
Drop ball tester
Semi-automatic scanning four-probe tester
Stylus Profilometer
Maximum Power Point Tracker
Perovskite Glass Transmittance Tester
Perovskite P1 Laser Scribing Multifunctional Testing Machine
Perovskite Online PL Tester
Perovskite Online Sheet Resistance Tester
Online Perovskite Film Thickness Tester
Perovskite Process Inspection Workstation
Portable IV Curve Tester
Portable EL Tester
Portable Thermal Imaging Tester
Solar Module Multi-Channel Testing System
PV Inverter Power Quality Tester
Drone EL Tester
IV Tester
IVEL Cell Sorting Machine
Stylus Profilometer
SP200
SP200 Stylus Profilometer: an advanced micro-nano measurement instrument featuring sub-angstrom resolution, ultra-low noise signal acquisition, precision motion control, and advanced calibration algorithms for exceptional performance.
▽ Excellent step - height repeatability and reproducibility of 5 Å, fully meeting the measurement accuracy requirements of the measured parts.
▽ Ultra - low - force constant - force sensor, adjustable from 1 - 50 mg.
▽ 5MP top-view color camera with optical navigation.
▽ Precise fully - automatic XY stage, Z - axis automatic lifting, 360° fully - automatic θ turntable.
SP200
Millennial Solar Stylus Profilometer
Excellent and powerful testing functions
Thin-film morphology optimization is key to enhancing the photoelectric conversion efficiency of perovskite cells.
The SP200 enables multi-point automated thickness mapping across the wafer with excellent repeatability, delivering reliable film thickness and positional data to support both one-step and two-step fabrication processes.
Probe surface profiling technology
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Millennial Stylus Profilometer SP200
Millennial Stylus Profilometer SP200
Fast Delivery and Comprehensive Support
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