Quantum Efficiency Tester
PL/EL Integrated System
PV-Reflectumeter
3D Confocal Microscope
In-Line Four Point Probe Tester
Four Point Probe Tester
In-Line Thin Film Thickness Tester
Raman Spectrometer
FTIR Spectrometer
Spectrophotometer
Automatic Spectroscopic Ellipsometer
Contact Resistance Tester
Ultra depth of field 3D microscope
Auto Visual Tester
VMM PV Vision Measuring Machine
Solar Cell Horizontal Tensile Tester
Steady State Solar Simulator for Solar Cell
Solar Cell UV Aging Test Chamber
Solar Cell Comprehensive Tensile Tester
Visual Inspection Tester
Wet Leakage Current Tester
PV Module EL Tester
PV Module UV Preconditioning Chamber
Steady State Solar Simulator for PV Module
Current Continuous Monitor
Potential Induced Degradation Test
Bypass Diode Tester
LeTID Test System
Reverse Current Overload Tester
Impulse Voltage Tester
Hipot Insulation Tester
Ground Continuity Tester
Hipot Insulation Ground Tester
Damp Heat Test Chamber
Humidity Freeze Test
Thermal Cycle Test Chamber
Dynamic Mechanical Load Tester
Static Mechanical Load Tester
Hail Impact Tester
Robustness of Termination Tester
Module Breakage Tester
Cut Susceptibility Tester
Peel Shear Strength Tester
Universal Testing Machine (Single-arm)
Universal Testing Machine (Double-arm)
Glass Transmittance Tester
Acetic Acid Test Chamber
EVA Degree of Crosslinking Test System
Junction Box Comprehensive Tester
Drop ball tester
Semi-automatic scanning four-probe tester
Stylus Profilometer
Maximum Power Point Tracker
Perovskite Glass Transmittance Tester
Perovskite P1 Laser Scribing Multifunctional Testing Machine
Perovskite Online PL Tester
Perovskite Online Sheet Resistance Tester
Online Perovskite Film Thickness Tester
Perovskite Process Inspection Workstation
Portable IV Curve Tester
Portable EL Tester
Portable Thermal Imaging Tester
Solar Module Multi-Channel Testing System
PV Inverter Power Quality Tester
Drone EL Tester
Semi-automatic scanning four-probe tester
FPP300SA
Sheet Resistance and Resistivity Testing
In perovskite solar cells, the sheet resistance of the transparent conductive layer (TCO) and the perovskite active layer directly impacts device efficiency. The four-point probe method enables rapid measurement of the lateral resistivity of thin films, facilitating the optimization of fabrication processes (e.g., annealing temperature, solution concentration).
Doping and Composition Optimization
The electrical properties of perovskite materials can be tuned via ion doping (e.g., Sn²⁺ substitution for Pb²⁺). Similarly, doping in TCO directly modifies its electrical performance. The four-point probe allows quantitative comparison of resistance variations under different doping concentrations, aiding in the screening of optimal formulations.
Stability Testing
Under temperature- and humidity-controlled environments, long-term monitoring of resistance changes in perovskite films helps investigate degradation mechanisms (e.g., ion migration, phase transitions).
When measuring a standard resistor sheet, repeatability is <0.2% (calculated as the standard deviation divided by the mean of 10 repeated measurements at the same point).
Fast Delivery and Comprehensive Support
Provide end-to-end support from product to production line operation through on-site operation guidance and after-sales technical support.