Quantum Efficiency Tester
PL/EL Integrated System
PV-Reflectumeter
3D Confocal Microscope
In-Line Four Point Probe Tester
Four Point Probe Tester
In-Line Thin Film Thickness Tester
Raman Spectrometer
FTIR Spectrometer
Spectrophotometer
Automatic Spectroscopic Ellipsometer
Contact Resistance Tester
Ultra depth of field 3D microscope
Auto Visual Tester
VMM PV Vision Measuring Machine
Solar Cell Horizontal Tensile Tester
Steady State Solar Simulator for Solar Cell
Solar Cell UV Aging Test Chamber
Solar Cell Comprehensive Tensile Tester
Visual Inspection Tester
Wet Leakage Current Tester
PV Module EL Tester
PV Module UV Preconditioning Chamber
Steady State Solar Simulator for PV Module
Current Continuous Monitor
Potential Induced Degradation Test
Bypass Diode Tester
LeTID Test System
Reverse Current Overload Tester
Impulse Voltage Tester
Hipot Insulation Tester
Ground Continuity Tester
Hipot Insulation Ground Tester
Damp Heat Test Chamber
Humidity Freeze Test
Thermal Cycle Test Chamber
Dynamic Mechanical Load Tester
Static Mechanical Load Tester
Hail Impact Tester
Robustness of Termination Tester
Module Breakage Tester
Cut Susceptibility Tester
Peel Shear Strength Tester
Universal Testing Machine (Single-arm)
Universal Testing Machine (Double-arm)
Glass Transmittance Tester
Acetic Acid Test Chamber
EVA Degree of Crosslinking Test System
Junction Box Comprehensive Tester
Drop ball tester
Semi-automatic scanning four-probe tester
Stylus Profilometer
Maximum Power Point Tracker
Perovskite Glass Transmittance Tester
Perovskite P1 Laser Scribing Multifunctional Testing Machine
Perovskite Online PL Tester
Perovskite Online Sheet Resistance Tester
Online Perovskite Film Thickness Tester
Perovskite Process Inspection Workstation
Portable IV Curve Tester
Portable EL Tester
Portable Thermal Imaging Tester
Solar Module Multi-Channel Testing System
PV Inverter Power Quality Tester
Drone EL Tester
Perovskite Glass Transmittance Tester
Online rapid measurement of large-area sample transmittance with uniformity statistical analysis and mapping visualization, enabling production line operators to use directly without sample sectioning.
♦ Thin Film Uniformity Inspection
Quantify thickness or compositional uniformity of thin films (e.g., perovskite light-absorbing layers like MAPbI₃, transparent electrodes like ITO/FTO) to identify local defects (e.g., pinholes, cracks) that impact device efficiency.
♦ Process Optimization & Feedback
During film-forming processes (e.g., slot-die coating, blade coating, evaporation, printing), real-time transmittance monitoring provides feedback on process parameters (speed, temperature) to optimize annealing time, solution concentration, and other conditions.
♦ High Efficiency & Automation
Large-area scanning (e.g., 0.6m×1.2m substrates) is completed within seconds—far faster than single-point spectrometers—suitable for high-speed production lines (e.g., roll-to-roll (R2R) processes). Integrates with automated systems for real-time sorting or alerts.
♦ Non-Contact & Non-Destructive Inspection
Avoids damage to fragile perovskite films or wet coatings caused by contact probes, especially critical for flexible substrates or freshly coated wet films.
♦ Data Integration & Traceability
Links with Manufacturing Execution Systems (MES) to store transmittance distribution maps for each substrate, building a process-performance database for yield analysis and process optimization.
♦ Cost Control
Early detection of defective products reduces material waste in downstream processes (e.g., electrode deposition), lowering overall manufacturing costs per cell.
Fast Delivery and Comprehensive Support
Provide end-to-end support from product to production line operation through on-site operation guidance and after-sales technical support.