Quantum Efficiency Tester
PL/EL Integrated System
PV-Reflectumeter
3D Confocal Microscope
In-Line Four Point Probe Tester
Four Point Probe Tester
In-Line Thin Film Thickness Tester
Raman Spectrometer
FTIR Spectrometer
Spectrophotometer
Automatic Spectroscopic Ellipsometer
Contact Resistance Tester
Ultra depth of field 3D microscope
Auto Visual Tester
VMM PV Vision Measuring Machine
Solar Cell Horizontal Tensile Tester
Steady State Solar Simulator for Solar Cell
Solar Cell UV Aging Test Chamber
Solar Cell Comprehensive Tensile Tester
Visual Inspection Tester
Wet Leakage Current Tester
PV Module EL Tester
PV Module UV Preconditioning Chamber
Steady State Solar Simulator for PV Module
Current Continuous Monitor
Potential Induced Degradation Test
Bypass Diode Tester
LeTID Test System
Reverse Current Overload Tester
Impulse Voltage Tester
Hipot Insulation Tester
Ground Continuity Tester
Hipot Insulation Ground Tester
Damp Heat Test Chamber
Humidity Freeze Test
Thermal Cycle Test Chamber
Dynamic Mechanical Load Tester
Static Mechanical Load Tester
Hail Impact Tester
Robustness of Termination Tester
Module Breakage Tester
Cut Susceptibility Tester
Peel Shear Strength Tester
Universal Testing Machine (Single-arm)
Universal Testing Machine (Double-arm)
Glass Transmittance Tester
Acetic Acid Test Chamber
EVA Degree of Crosslinking Test System
Junction Box Comprehensive Tester
Drop ball tester
Semi-automatic scanning four-probe tester
Stylus Profilometer
Maximum Power Point Tracker
Perovskite Glass Transmittance Tester
Perovskite P1 Laser Scribing Multifunctional Testing Machine
Perovskite Online PL Tester
Perovskite Online Sheet Resistance Tester
Online Perovskite Film Thickness Tester
Perovskite Process Inspection Workstation
Portable IV Curve Tester
Portable EL Tester
Portable Thermal Imaging Tester
Solar Module Multi-Channel Testing System
PV Inverter Power Quality Tester
Drone EL Tester
FTIR Spectrometer
FTIR4000
Customized specifically for applications in the photovoltaic industry
The infrared absorption spectrum can be used to study the configuration and distribution of Si-H bonds in amorphous silicon and microcrystalline silicon materials. We generally define the microscopic structural parameter R* to evaluate the microstructural quality of silicon films.
A smaller R* indicates that hydrogen atoms in the amorphous silicon film predominantly exist in the form of Si-H bonds, resulting in a dense film structure.
A larger R* suggests that hydrogen atoms in the amorphous silicon film are more likely to exist in the form of Si-H₂ bonds or (Si-H₂)n species, leading to a loose film structure with more pores and defects and a poorer network structure.
Additionally, we can obtain the hydrogen content in silicon materials through the one-click analysis module for the R value
Outstanding System Design
Integrated optical table design with a fully sealed instrument.
Beam splitter with moisture-proof film and a large-capacity regenerable desiccant box, featuring a visible color-changing window for quick identification of humidity conditions.
The instrument employs a gold-coated conical mirror with a large aperture, achieving over 97% reflectivity, ensuring excellent energy efficiency.
Off-axis mirrors are processed using cutting techniques, resulting in a highly efficient and consistent infrared optical system.
Fast Delivery and Comprehensive Support
Provide end-to-end support from product to production line operation through on-site operation guidance and after-sales technical support.