Quantum Efficiency Tester
PL/EL Integrated System
PV-Reflectumeter
3D Confocal Microscope
In-Line Four Point Probe Tester
Four Point Probe Tester
In-Line Thin Film Thickness Tester
Raman Spectrometer
FTIR Spectrometer
Spectrophotometer
Automatic Spectroscopic Ellipsometer
Contact Resistance Tester
Ultra depth of field 3D microscope
Auto Visual Tester
VMM PV Vision Measuring Machine
Solar Cell Horizontal Tensile Tester
Steady State Solar Simulator for Solar Cell
Solar Cell UV Aging Test Chamber
Solar Cell Comprehensive Tensile Tester
Visual Inspection Tester
Wet Leakage Current Tester
PV Module EL Tester
PV Module UV Preconditioning Chamber
Steady State Solar Simulator for PV Module
Current Continuous Monitor
Potential Induced Degradation Test
Bypass Diode Tester
LeTID Test System
Reverse Current Overload Tester
Impulse Voltage Tester
Hipot Insulation Tester
Ground Continuity Tester
Hipot Insulation Ground Tester
Damp Heat Test Chamber
Humidity Freeze Test
Thermal Cycle Test Chamber
Dynamic Mechanical Load Tester
Static Mechanical Load Tester
Hail Impact Tester
Robustness of Termination Tester
Module Breakage Tester
Cut Susceptibility Tester
Peel Shear Strength Tester
Universal Testing Machine (Single-arm)
Universal Testing Machine (Double-arm)
Glass Transmittance Tester
Acetic Acid Test Chamber
EVA Degree of Crosslinking Test System
Junction Box Comprehensive Tester
Drop ball tester
Semi-automatic scanning four-probe tester
Stylus Profilometer
Maximum Power Point Tracker
Perovskite Glass Transmittance Tester
Perovskite P1 Laser Scribing Multifunctional Testing Machine
Perovskite Online PL Tester
Perovskite Online Sheet Resistance Tester
Online Perovskite Film Thickness Tester
Perovskite Process Inspection Workstation
Bypass Diode Tester
ME-PV-BDT
“Importance of Bypass Diodes in Photovoltaic Modules”
When solar cells are subjected to uneven radiation or partial shading, or even when there are inherent differences in the manufacturing process among solar cells, electrical mismatches will occur in photovoltaic modules. The shading situation is a common phenomenon, especially in (BIPV) systems. In a photovoltaic module, all solar cells carry the same current. When one or more solar cells are shaded, the maximum allowable current will decrease, thereby reducing the output power. In addition, the shaded cells may reach high temperatures, leading to the hot spot phenomenon and permanent damage to the photovoltaic module.
In order to prevent the consequences of shading, manufacturers install one or more diodes on commercial photovoltaic modules. The bypass (BP) diodes are connected in reverse parallel between the positive and negative output terminals of the solar cell string and are typically used for a small group of series-connected cells. If a cell becomes reverse-biased, it will directly bias the BP diode. The function of the bypass diode is to provide a bypass path for the current. When the shading is removed, the cell will usually return to the forward-biased state, and the diode will return to the reverse-biased state. Therefore, the electricity generated by the normal solar cells will not be affected by other shaded solar cells.
Functional Features
●Monitor the temperature of the diode surface and the module surface;Monitor the current of the diode and the voltage drop across the two ends of the diode;Monitor the reverse leakage current of the diode;Test the forward volt-ampere characteristics of the diode.
●Intelligently control the current size, and control the power supply to output current with a pulse time less than 1ms;
●In the pulse current stage, collect parameters such as pulse current, diode voltage drop, junction box temperature, etc.;
●Automatically simulate the relationship between VD and VJ, obtain VD data at 75℃, ID=Isc, and calculate TJ value at 75℃;
●Can test the forward volt-ampere characteristics of the diode;
●High-speed acquisition card collects voltage, current and temperature data in the conversion stage;
●Through the fast circuit converter, realize the fast switching between the forward voltage circuit and the reverse voltage circuit within 10ms;
●Record the fast change of the circuit The voltage and current changes of the two ends of the diode during the conversion process;
●Real-time display of the voltage and current (including leakage current) change curves during the voltage conversion process, and the curves can be exported;
●Automatically control the reverse voltage application through the temperature change trend;
●Reverse leakage current alarm protection; when the set threshold is exceeded, the alarm is automatically triggered and the power is disconnected;
●Safety protection: Each power supply has overcurrent/overvoltage/overpower protection function, the power supply is automatically disconnected, and the test is stopped.
1. Voltage test range: 0-20V;
2. Voltage test accuracy: 0.5%±40mV;
3. Voltage resolution: 0.1V;
4. Current test range: 0-100A;
5. Current test accuracy: 0.5%±30mA;
6. Current resolution: 0.01A;
1. Voltage test range: 0-100V;
2. Voltage test accuracy: 0.5%±40mV;
3. Voltage resolution: 0.1V;
4. Current test range: 0-30A;
5. Current test accuracy: 0.5%±30mA;
6. Current resolution: 0.01A
1. Pulse current adjustment range: 0A~50A;
2. Current test accuracy: ±1.5%;
3. Pulse width: ≤1ms;
4. Pulse width range: 100μs~1 ms (resolution 1 nanosecond);
5. Output voltage: 0V~20V;
6. Forward voltage drop measurement accuracy: ≤1%
1. Current range: 0A~1mA;
2. Current resolution: 1uA;
3. Current accuracy: 0.2%FS+5uA;
1. Voltage range: 0~50V/0~500V;
2. Voltage resolution: 0.001V;
3. Voltage accuracy: 2%
1. Temperature range: 10-200℃;
2. Temperature fluctuation: 0.5℃;
3. Temperature stability: ±1℃;
4. Temperature resolution: 0.1℃;
5. Cavity size: 500*500*520mm
1. Sampling frequency: 800HZ~6MHZ;
2. Resolution: 12bits;
3. DC accuracy: 0.05%;
4. Range: +/-2.5V;
5. Input impedance: 10KΩ;
6. Temperature drift: 100ppm
Fast Delivery and Comprehensive Support
Provide end-to-end support from product to production line operation through on-site operation guidance and after-sales technical support.