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Contact Resistance Tester
TLM-STD
The parameter extraction method of the contact resistance of solar cell electrodes
In the optimization of solar cell electrodes, contact resistance is an important aspect to consider. The magnitude of contact resistance is not only related to the contact geometry but also to the diffusion and sintering processes. Measuring contact resistivity can reflect issues present in the diffusion, electrode fabrication, and sintering processes.
By varying the electrode spacing d the relationship curve between RTLM and d can be obtained, allowing for the extraction of the interface contact resistance Rc and the sheet resistance Rsh of the material under study.
Two Testing Functions
This device features two testing functions: TLM contact resistivity testing and line resistance testing, which can be switched between.
Contact resistivity: used to measure contact resistance, thin film resistance, and contact resistivity, with a total of 22 small compartments. Each compartment can accommodate cut solar cells with a width of 6 to 10 mm and a length of 230 mm.
Line resistance:used to measure the line resistance of grid lines, capable of testing cut solar cells with a width of 230 mm. The platform is equipped with a vacuum suction device to ensure reliable sample positioning. Custom platforms can be designed as needed.
Multi-Probe for Flexible Measurement and Analysis
To meet the ever-changing application needs of customers, Millennial offers fully customized services. By optimizing the layout, spacing, and selection of probes, comprehensive and high-precision control and analysis of different process samples can be achieved.
XYZ Three-Axis Motion Control System
The XYZ three-axis motion control system employs a three-degree-of-freedom linear motion design, consisting of three independent linear actuators to achieve precise motion control in the X, Y, and Z directions.
X and Y Axes: The automatic platform for the X and Y axes has a maximum travel compatible with 250 × 250 mm, enabling fully automated multi-point scanning and the creation of complete sample resistance distribution maps.
Z Axis: Utilizes a precision electric displacement axis, with programmed control over the probe's downward pressure, achieving a control precision of up to 5 mm, protecting the surface morphology of the grid lines and improving measurement accuracy.
Probe diameter: 0.9 mm;
Probe pressure: 0.4 ~ 0.7 N (adjustable);
Probe lifespan: > 100,000 times
Standard: 1.2-1.8 mm;
Adjustable probe: 0.9 mm;
Fixed probe: optional;
Other specifications can be customized as needed
Test data analysis and storage functionality;
Measurement data can be exported in Excel format;
Test data can generate histograms
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Millennial Contact Resistance Tester
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