Quantum Efficiency Tester
PL/EL Integrated System
PV-Reflectumeter
3D Confocal Microscope
In-Line Four Point Probe Tester
Four Point Probe Tester
In-Line Thin Film Thickness Tester
Raman Spectrometer
FTIR Spectrometer
Spectrophotometer
Automatic Spectroscopic Ellipsometer
Contact Resistance Tester
Ultra depth of field 3D microscope
Auto Visual Tester
VMM PV Vision Measuring Machine
Solar Cell Horizontal Tensile Tester
Steady State Solar Simulator for Solar Cell
Solar Cell UV Aging Test Chamber
Solar Cell Comprehensive Tensile Tester
Visual Inspection Tester
Wet Leakage Current Tester
PV Module EL Tester
PV Module UV Preconditioning Chamber
Steady State Solar Simulator for PV Module
Current Continuous Monitor
Potential Induced Degradation Test
Bypass Diode Tester
LeTID Test System
Reverse Current Overload Tester
Impulse Voltage Tester
Hipot Insulation Tester
Ground Continuity Tester
Hipot Insulation Ground Tester
Damp Heat Test Chamber
Humidity Freeze Test
Thermal Cycle Test Chamber
Dynamic Mechanical Load Tester
Static Mechanical Load Tester
Hail Impact Tester
Robustness of Termination Tester
Module Breakage Tester
Cut Susceptibility Tester
Peel Shear Strength Tester
Universal Testing Machine (Single-arm)
Universal Testing Machine (Double-arm)
Glass Transmittance Tester
Acetic Acid Test Chamber
EVA Degree of Crosslinking Test System
Junction Box Comprehensive Tester
Drop ball tester
Semi-automatic scanning four-probe tester
Stylus Profilometer
Maximum Power Point Tracker
Perovskite Glass Transmittance Tester
Perovskite P1 Laser Scribing Multifunctional Testing Machine
Perovskite Online PL Tester
Perovskite Online Sheet Resistance Tester
Online Perovskite Film Thickness Tester
Perovskite Process Inspection Workstation
Portable IV Curve Tester
Portable EL Tester
Portable Thermal Imaging Tester
Solar Module Multi-Channel Testing System
PV Inverter Power Quality Tester
Drone EL Tester
Four Point Probe Tester
FPP230A
Compared to non-contact eddy current measurements, four-probe technology offers higher resolution, good accuracy, long-term stability, and a wider measurement range.
Non-contact eddy current measurements combine the resistivity of the substrate's thin layer with that of the surface layer, leading to uncertainty.
Product Applications
● Semiconductors and solar cells (monocrystalline silicon, polycrystalline silicon, perovskite)
● LCD panels (ITO/AZO)
● Functional materials (thermoelectric materials, carbon nanotubes, graphene, silver nanowires, conductive fiber cloth)
● Semiconductor processes (metal layers, ion implantation, diffusion layers)
● Amorphous alloys
Rapid Material Characterization
The PC software (provided with the system) can perform all necessary measurements and calculations for thin film resistance, resistivity, and conductivity, making material characterization effortless. It also automatically executes correction factor calculations.
Non-Destructive Testing
The four-point probe is designed with the measurement of precision samples in mind, featuring gentle spring-loaded contacts and rounded tips.
Probe pressure is maintained at 3-5N to prevent the probe from piercing fragile films while still providing good electrical contact.
Fully Automatic Scanning
There are two measurement modes: “Manual Arbitrary Point Measurement” and “Fully Automatic Multi-Point Measurement.” The XY-axis automatic platform has a maximum travel compatible with 230mm x 230mm. Multiple preset options are available, and custom testing plans can be created by simply providing coordinates for one-click measurement.
<0.2% (standard resistor)
≤2% (solar cells, such as boron-diffused/POLY annealed silicon wafers)
Absolute positioning accuracy: 40 μm
Repeatability positioning accuracy: 5 μm
Displacement Resolution:1 μm
Related Videos
Millennial Measurement of Surface Sheet Resistance Characteristics of Perovskite Films
Millennial FPP230A Four-Point Probe Tester
Fast Delivery and Comprehensive Support
Provide end-to-end support from product to production line operation through on-site operation guidance and after-sales technical support.