Quantum Efficiency Tester
PL/EL Integrated System
PV-Reflectumeter
3D Confocal Microscope
In-Line Four Point Probe Tester
Four Point Probe Tester
In-Line Thin Film Thickness Tester
Raman Spectrometer
FTIR Spectrometer
Spectrophotometer
Automatic Spectroscopic Ellipsometer
Contact Resistance Tester
Ultra depth of field 3D microscope
Auto Visual Tester
VMM PV Vision Measuring Machine
Solar Cell Horizontal Tensile Tester
Steady State Solar Simulator for Solar Cell
Solar Cell UV Aging Test Chamber
Solar Cell Comprehensive Tensile Tester
Visual Inspection Tester
Wet Leakage Current Tester
PV Module EL Tester
PV Module UV Preconditioning Chamber
Steady State Solar Simulator for PV Module
Current Continuous Monitor
Potential Induced Degradation Test
Bypass Diode Tester
LeTID Test System
Reverse Current Overload Tester
Impulse Voltage Tester
Hipot Insulation Tester
Ground Continuity Tester
Hipot Insulation Ground Tester
Damp Heat Test Chamber
Humidity Freeze Test
Thermal Cycle Test Chamber
Dynamic Mechanical Load Tester
Static Mechanical Load Tester
Hail Impact Tester
Robustness of Termination Tester
Module Breakage Tester
Cut Susceptibility Tester
Peel Shear Strength Tester
Universal Testing Machine (Single-arm)
Universal Testing Machine (Double-arm)
Glass Transmittance Tester
Acetic Acid Test Chamber
EVA Degree of Crosslinking Test System
Junction Box Comprehensive Tester
Drop ball tester
Semi-automatic scanning four-probe tester
Stylus Profilometer
Maximum Power Point Tracker
Perovskite Glass Transmittance Tester
Perovskite P1 Laser Scribing Multifunctional Testing Machine
Perovskite Online PL Tester
Perovskite Online Sheet Resistance Tester
Online Perovskite Film Thickness Tester
Perovskite Process Inspection Workstation
Portable IV Curve Tester
Portable EL Tester
Portable Thermal Imaging Tester
Solar Module Multi-Channel Testing System
PV Inverter Power Quality Tester
Drone EL Tester
PL/EL Integrated System
ME-PSC-PL/EL tandem
Introduction to PL/EL Integrated Machine
PL Photoluminescence Imaging: This non-contact testing method helps monitor abnormalities during the manufacturing process and provides insights into the surface defect distribution of single-junction solar cells.
EL Electroluminescence Imaging:By applying voltage through the probe, defects in the cells can be analyzed, particularly those related to electrode and contact anomalies. This is a contact-based test, suitable for finished solar cells.
Defect type identification function
The intelligent EL/PL test system can identify and customize according to the types of defects, such as black spots, pockmarks, black corners, scratches, etc.
Surface Separation Analysis Function
This feature assists in analyzing the location and causes of defects. By applying a bias electric field or altering the carrier distribution, changes in the dominant recombination areas can be observed.
Versatile R&D Equipment for Photovoltaic Laboratories and Quality Control
The Millennial PL/EL tandem is an advanced multifunctional imaging device that includes the following features:
• iVoc • Jo Mapping • Rs Mapping • Local Statistics
High resolution: 60 million pixels
High sensitivity: 1 million pixels
Exposure time: 10 microseconds to 30 seconds
Responsive range: 400 nm to 1200 nm
Lens: High-definition wide-angle lens
Basic Functions: EL imaging, PL imaging, Rs imaging
Advanced Functions: Color Mapping, Jo analysis, iVoc analysis; Rs analysis, body-surface separation
Fast Delivery and Comprehensive Support
Provide end-to-end support from product to production line operation through on-site operation guidance and after-sales technical support.